Stmicroelectronics (research & Development) Limited

Stmicroelectronics Gmbh

Stmicroelectronics (grenoble 2) Sas

Stmicroelectronics R&d Limited

Stmicroelectronics Sa (morocco)

Matthew Purcell

Graeme Storm

John Kevin Moore

Robert K Henderson

Derek Tolmie

Min Qu

Laurent Simony

Tarek Lule

Mhamed El Hachimi

Rachel Elliott

Arnauld Laflaquiere

Michael Wigley

An image sensor having improved dynamic range includes a signal that is read out for a selection of pixels which act as a calibration to govern the choice of exposure levels to be applied to the rest of the array. In this way, the sensor is operable to adapt to variations in scene intensity. The pixels in the array are vertically and horizontally addressed so as to enable accounted for small areas of intensity variation across an imaged scene.

Image sensor with improved dynamic range

An image sensor includes an array of pixels. Each pixel has at least one photo-sensitive element. Readout circuitry receives an analog signal from each pixel at a first time and at a second time, between which the analog signal changes. The image sensor further includes associated support circuitry which is a source of time variant noise. The signal level at both first and second times includes pixel noise. Sample and hold circuitry is provided to maintain substantially level at least a proportion of this support circuitry noise time invariant at the sensor output between the first time and the second time.

Image sensor with sample and hold circuitry for addressing time variant noise

Each column of pixels in an image sensor array has at least two column bitlines connected to an output of each pixel. A readout input circuit includes first inputs and a second input. Each first input is connected, via a capacitance, to a comparator input node. The second input is connected via a capacitance to the same comparator input node. The first inputs receive, in parallel, an analog signal acquired from the pixels via the column bitlines. The analog signals vary during a pixel readout period and have a first level during a first calibration period and a second level during a second read period with the analog signals being constantly read onto the capacitances during both the first calibration period and the second read period. The comparator compares an average of the signals on the plurality of first inputs to the reference signal.

Image sensor arrangement

An image sensor has a per-column ADC arrangement including first and second capacitors allowing a comparator circuit to perform correlated double sampling. The capacitors are continuously connected to, respectively, the analog pixel signal and a ramp signal without use of a hold operation. The comparator circuit comprises a differential input being connected to the junction of the two capacitors and being biased by a reference signal. The reference signal is preferably sampled and held from a reference voltage. The use of a differential input as first stage of the comparator addresses problems arising from ground voltage bounce when a large pixel array images a scene with low contrast. Connectivity of the differential input stage allows the ramp signal to see a constant capacitive load thus reduce image artifacts referred to as smear.

Analog-to-digital conversion in image sensors

An image sensor has a per-column ADC arrangement including first and second capacitors for correlated double sampling, and a comparator circuit. The capacitors are continuously connected to, respectively, the analog pixel signal and a ramp signal without use of a hold operation. The comparator circuit comprises a differential amplifier having one input connected to the junction of the two capacitors and another input connected to a reference signal. The reference signal is preferably sampled and held from a reference voltage. The use of a differential amplifier as first stage of the comparator addresses problems arising from ground voltage bounce when a large pixel array images a scene with low contrast.

Analog-to-digital conversion in image sensors using a differential comparison

An image sensor includes a pixel array, and a correlated double sample circuit coupled to one of the pixels in the pixel array. The correlated double sample circuit includes first and second inputs, and first and second sample capacitors respectively coupled to the first and second inputs. The first input is for receiving an analog signal from a pixel, and the second input is for receiving a time varying reference signal. The analog signal varies during a pixel readout period, and has a first level during a first reset period and a second-level during a second read period. A comparator circuit compares the time varying reference signal and the analog signal. The analog signal and the time varying reference signal are constantly read onto one of the first and second sample capacitors during both the first reset period and the second read period.

Analog to digital converter

A column current source for an image sensor includes an array of pixels arranged in rows and columns, a reference current source, a transistor connected as a source follower to the reference current source and forming one half of a current mirror, and a plurality of current sources each connected to a column of pixels and with each current source forming the other half of the current mirror, thereby mirroring the reference current source. The current sources are connected to a first common node. A resistor is connected between the first common node and a second common node. One or more resistors are connected in series between the second common node and the transistor drain, and two or more switches are selectively operable to short circuit the resistors allowing the current sources to provide more than two current levels, thereby optimizing the image sensor current consumption for mobile devices.

Column current source

An image sensor includes a power supply ripple rejection circuit having an input connected to a supply voltage reference, and an output connected to an output voltage reference. The power supply ripple rejection circuit reduces the affect of variance in the supply voltage reference on the output voltage reference.

Image sensor power supply including at least one ripple rejection circuit for reducing variations in the supply voltage

The image sensor makes use of a distributed amplifier having its non-inverting input provided by a pixel amplifier transistor, and its inverting input and output provided in the pixel's column circuitry. The distributed amplifier is directly integrated with the image sensor's ADC circuit, and sampling and autozero are performed in a single step, thus reducing the number of noise contributions made by the components of the image sensor's readout chain.

Image sensors with distributed amplifiers and related methods

An image sensor includes an array of pixels arranged in rows and columns. A reference current source provides the reference current to a transistor forming one half of a current mirror. Each column has a current source, which forms the other half of a current mirror. A switch is provided to selectively connect a resistance between ground and the transistor. When the resistance is connected, the transistor is starved of gate-source voltage, which reduces the current supplied by each current source.

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Edinburgh, United Kingdom

Matthew Purcell