Micron Technology Incorporated

Aptina Imaging Corporation

Avago Technologies General IP Pte, Ltd.

Matthew Michael Borg

Jeffery S Beck

Christopher D Silsby

William George Gazeley

Dietrich Werner Vook

Ray Alan Mentzer

Charles Myers

Frank J DeMonte

Jeffrey Steven Beck

Ray Allen Mentzer

A method and apparatus providing an imager with shared power supply and readout lines. A pixel array has a plurality of pixels arranged in rows and columns. Each column of the array comprises a column line coupled to receive pixel signals from the pixels in the column and selectively operated to provide a supply voltage to at least one pixel in a different column.

Method and apparatus providing an imager with a shared power supply and readout line for pixels

A pixel circuit includes a pixel-capture device having a pixel node and operable to convert light intensity into a pixel signal at the pixel node, the pixel signal representing a captured pixel. A row node carries a row signal that is operable to both (a) enable passage of the pixel signal from the pixel node to a column node during a readout phase of the captured pixel, and (b) set the pixel node to a predetermined signal level during a reset phase of the captured pixel. The reset phase and the readout phase are configured to occur during different time intervals. A reset node is included for carrying a reset signal that is operable together with the row signal to (a) enable passage from the pixel node to the column node during the readout phase, and (b) set the pixel node to predetermined signal level during the reset phase.

Circuit for an active pixel

An image sensor including a substrate, at least one metal layer, and a plurality of pixels arranged in array. Each pixel includes a sense element disposed in the substrate and at least one metal interconnect segment disposed in the at least one metal layer. The array includes a pair of perpendicular axes extending from an optical center, wherein for a line of pixels extending perpendicularly from one of the axes to a peripheral edge of the array a spacing between the sense elements of consecutive pairs of pixels of the line is at least equal to a spacing between the associated at least one metal interconnect segments, and wherein for at least one consecutive pair of pixels of the line the spacing between the sense elements is greater by an incremental amount than the spacing between the corresponding at least one metal interconnect segments.

Pixel with spatially varying sensor positions

An active pixel sensor array sampling system includes a plurality of video circuits and reset circuits. A video circuit generates a video voltage from each one of the pixels of a column of pixels. An associated reset circuit generates a reset voltage for each of the pixels of a column of pixels. The video circuits and the reset circuits are closed loop sample and hold circuits. The active pixel sensor array is integrated on an integrated circuit.

Sample and hold circuit and active pixel sensor array sampling system utilizing same

A method and apparatus for optimizing the voltage supply of an image sensor pixel array to minimize pixel noise and maximize dynamic range is disclosed. The voltage supply is adjusted in response to the exposure level of the pixel array when it captures an image. The voltage supply is increased in higher exposure levels to expand the dynamic range of the pixel array. In lower exposure levels, when the full dynamic range of the pixel array is not utilized, the voltage supply is decreased to lower pixel noise level and reduce its effect on image quality.

Method and apparatus for optimizing image sensor noise and dynamic range

A pixel circuit includes a silicon substrate having a photodiode that converts light intensity into a voltage signal and two metal layers disposed on the substrate having a pixel control circuit. The first metal layer includes a row trace and a reset trace and the second metal layer includes a column trace and a voltage supply trace. The row trace carries a signal that activates a switch for coupling the photodiode to the column trace during a readout phase and clears the voltage at the photodiode during a reset phase. The column trace interfaces with a signal capture circuit in a CMOS array of pixels for capturing a digital image that corresponds to each voltage level at each photodiode.

Circuit for an active pixel sensor

An active pixel sensor (APS) image sensor comprises an array of pixel circuits corresponding to rows and columns of pixels, a plurality of amplifiers that buffer signals output by the array of pixel circuits, and a plurality of sample and hold circuits that read the buffered signals. A routing mechanism is positioned between the array of pixel circuits and the plurality of amplifiers. A controller selects a set of the pixel circuits for sampling and is configured to control the routing mechanism to couple each pixel circuit in the set to a different one of the amplifiers during a normal mode of operation and to couple each pixel circuit of a subset of pixel circuits in a first set of pixel circuits to a different amplifier of a first subset of the amplifiers, to couple each pixel circuit of a subset of pixel circuits in a second set of pixel circuits to a different amplifier of a second subset of the amplifiers, and to connect the amplifiers of the first and second subsets of amplifiers in pairs to a common one of the sample and hold circuits during a sub-sampling mode of operation.

Analog vertical sub-sampling in an active pixel sensor (APS) image sensor

A method of sampling image signals generated by pixel circuits of an active pixel sensor (APS) image sensor. The APS image sensor supports a normal mode of operation and a sub-sampling mode of operation. The method includes providing a plurality of column amplifiers. A row of pixels circuits to sample is selected. Image signals from each pixel circuit in the selected row are routed to a different one of the plurality of column amplifiers when the APS image sensor is in the normal mode of operation. Image signals from a plurality of the pixel circuits in the selected row are routed to one of the plurality of column amplifiers when the APS image sensor is in the sub-sampling mode of operation.

Sampling image signals generated by pixel circuits of an active pixel sensor (APS) image sensor in a sub-sampling mode

A ground referenced pixel reset circuit is disclosed. The ground referenced pixel reset circuit supplies a pixel with a reset signal such that when the reset signal is asserted high, the reset signal is at a ground referenced reset voltage independent from a supply voltage. The pixel includes a photosensor, such as a photodiode, that is coupled to a ground having a same potential as the ground of the reference voltage supply. In this manner, noise caused by fluctuations in the supply voltage is reduced.

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Albany, OR, United States of America

Matthew Michael Borg