The Boeing Company

The Boenig Company

Matthew Mark Thomas

Michael P Gleason

William D Smart

Michael S Dixon

Robert Pless

Xue Wu Liu

Hui Lin Yang

Ronald L Bookout

Philip Lawrence Freeman

Scott R Johnston

David J Sundquist

Michael Ray Miller

Anthony C Roberts

Daniel Eugene Pulcher

Nathaniel Philip Roman

Robert Ray Johnson

Lucian Woods

Gregory M Sisti

Steven M Volz

James W Brown, Jr

John Joseph Haake

Anthony Carl Roberts

Douglas E Reed

Xue Liu

John Koval

A method is provided for measuring and quantifying optical distortion of a transparent object using a single image. Embodiments provided herein include a method including: receiving an image of an object and a transparent object, where the object is visible through the transparent object, where a portion of the image of the object is visible through the transparent object is an inside region of interest (iROI), where a portion of the image of the object not viewed through the transparent object is an outside region of interest (oROI); determining measured pixel locations for a plurality of identified pixels in the image, the plurality of identified pixels corresponding to the distinct points in the image; calculating virtual locations in the image representing the distinct points within the iROI; determining, for respective distinct points within the iROI, differences between the virtual location and the measured pixel location.

Method and apparatus for determining optical distortion of an object from a single image

A system includes a robotic arm of a robotic device, an imaging device coupled to the robotic arm, and a processor configured to control movement of the robotic arm to move the imaging device along a preprogrammed measurement path of a transparency while prompting the imaging device to record images of localized portions of the transparency. The processor is configured to determine one or more localized transparency characteristics based on an analysis of the images of the localized portions.

System and method for measuring localized characteristics of a transparency

An inspection system for detecting optical defects in a transparency includes a first rounded array of first elongated light elements, and a second rounded array of second elongated light elements. The second rounded array is positionable radially outboard of the first rounded array. The inspection system further includes a light-element-moving system configured to radially translate at least the first elongated light elements. The inspection system also includes an image recording device positionable on a side of the transparency opposite the first and second rounded arrays and configured to record images of the transparency during radial translation of at least the first elongated light elements during backlighting of the transparency. The inspection system includes a processor configured to analyze the images recorded during radial translation of at least the first elongated light elements, and detect optical defects in the transparency based on analysis of the images.

Dynamic backlighting system and method for inspecting a transparency

An optical defect detection system is provided for recording an image of a transparency for detecting optical defects therein. The transparency may be formed with a contour. The defect detection system may comprise a light source, a diffuser and an image recording device for recording images of the transparency. The light source is configured to emit light and may be positioned adjacent one of the sides of the transparency. The image recording device may be positioned on a side of the transparency opposite the diffuser. The diffuser may be contoured complementary to the contour of the transparency and may be positioned between the light source and the transparency.

System and method for detecting optical defects in transparencies

The present disclosure is related to articles, such as aircraft windows and canopies, including a non-conductive substrate and a conductor pattern including one or more trace lines deposited onto the outside of the substrate such that the entire outside surface of the substrate is not coated with the conductor pattern. The present disclosure also provides methods of dissipating electrostatic charge from non-conductive substrates.

Dissipation of electrostatic charge from substrates

A method of detecting optical defects in a transparency may comprise the steps of providing a digital image of the transparency having a plurality of image pixels and detecting at least one candidate defect. The candidate defect may be detected by determining a grayscale intensity of each one of the image pixels and calculating an intensity gradient across adjacent pairs of the image pixels. Each image pixel may be assigned a gradient value comprising a maximum of the absolute value of the intensity gradients associated with the image pixel. A gradient image may be constructed comprising the gradient values assigned to corresponding ones of the image pixels. Image pixels may be identified as candidate pixels if such image pixels have a gradient value exceeding a gradient threshold. The candidate pixels may comprise the optical defect.

Method for detecting optical defects in transparencies

A system for evaluating optical distortion in an aircraft transparency, such as a windshield, is disclosed. The system utilizes high resolution digital images (a reference image and a test image) of a test grid structure having a pattern of visible index locations. In one embodiment, the test image is taken through the transparency under test, and the reference image is taken without the transparency. The two images are processed and analyzed by a computing device to determine displacement of each index location, relative to the reference image. The displacement data is further processed to obtain vector divergence field data that represents a quantitative measurement of the optical distortion. The optical distortion measurement data is then rendered in a suitable format that allows the transparency to be rated against certain quality criteria.

Evaluation of optical distortion in a transparency

Growing community of inventors

Maryland Heights, MO, United States of America

Matthew Mark Thomas