Itt Manufacturing Enterprises, Inc.

Matthew L Gypson

Michael E Dobbs

Benjamin R Neff

Jeff D Pruitt

Remotely sensing a target may include generating a first beam of optical radiation that is modulated at a first frequency and polarized at a first polarization. A second beam of optical radiation that is modulated at a second frequency and polarized at a second polarization may also be generated. The first and second beams of optical radiation may be transmitted to the target. Radiation at the first polarization and radiation at the second polarization may be detected from the target using a phase sensitive technique and the first and second frequencies.

Active multiple-color imaging polarimetry

A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a sweep frequency and a reference source configured to emit optical radiation at a reference wavelength. A first modulator may be configured to modulate the first optical radiation at a first frequency, and a second modulator may be configured to modulate the second optical radiation at a second frequency that is different from the first frequency and the sweep frequency. A science detector may be configured to detect the optical radiation from the first modulator and the second modulator after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the science signal that are present at the first and second frequencies.

Active remote sensing using a simultaneous spectral sampling technique

A system for sensing a characteristic of a sample may include a tunable source configured to emit optical radiation that varies over a wavelength range at a first frequency and a reference source configured to emit optical radiation that varies in amplitude at a second frequency. A science detector may be configured to detect the optical radiation from the tunable source and the reference source after interaction with the sample and generate a science signal. A number of lock-in amplifiers may be respectively configured to generate components of the science signal that are present at the first and second frequencies. A processor may be configured to determine a characteristic of the sample based on the components of the science signal that are present at the first and second frequencies.

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Fort Wayne, IN, United States of America

Matthew L Gypson