The University of Arizona

University of Rochester

Matthew Kupinski

Jannick P Rolland

Eric Clarkson

Jinxin Huang

Bijan Najafi

Phillip H Kuo

Systems and methods for assessing multi-layer structures in which a spectrum array is generated from low coherence interferometry and input into a statistical estimator, which determines the thickness and layer number based on the inputted spectrum and other information, including information about a source intensity noise, Poisson noise, and dark noise associated with the low coherence interferometry.

Measurement of multi-layer structures

The present invention provides methods and devices for correcting motion related imaging artifacts. In particular, the methods include positioning a device configured to detect motion at a region of interest on an object, simultaneously obtaining an image data set of the region of interest and a motion data set at the region of interest with the device, and correcting motion related imaging artifacts with an algorithm configured to identify time periods of motion from the motion data set, and correct the image data set corresponding to the identified time periods of motion.

Systems, methods and devices for performing motion artifact correction

Systems and methods for determining thickness of lipid and aqueous layers of a tear film in which a spectrum array is generated from optical coherence tomography and input into a statistical estimator, which determines the thickness of the lipid and/or aqueous layers at a nanometer resolution based on the inputted spectrum and other information, such as information about a laser intensity noise, Poisson noise, and dark noise associated with the OCT.

Growing community of inventors

Tucson, AZ, United States of America

Matthew Kupinski