Agilent Technologies, Inc.

Matthew Kole

Andrew Ghetler

Christopher Ryan Moon

An apparatus and method for analyzing particulates in a sample is disclosed. The method includes placing the sample on a moveable stage in an apparatus having a tunable MIR light scanner and a visible imaging system, the stage moving between the MIR light scanner and the visible imaging system, providing a visible image of the sample, and receiving user input as to a region of the sample that is to be analyzed. The sample is then moved to the MIR light scanner, the MIR light scanner generating an MIR light beam that is focused to a point on the specimen and measuring light reflected from the specimen. The specimen is then scanned at a first MIR wavelength by moving the specimen relative to the MIR light beam, and particles are identified that meet a selection criterion. The MIR absorption spectrum of each of the identified particle is then automatically measured.

Mid-infrared scanning system for analyzing particulates

An ATR scanning system and a method for positioning a specimen against the reflective surface of an ATR objective are disclosed. The scanning system includes an ATR objective, a controller, a stage, and a height profiler. The controller forms an image of the reflective surface. The stage moves a specimen in a direction toward the reflective surface at a speed determined by the controller. The height profiler measures a minimum distance between the specimen and the reflective surface as the z-axis stage moves the specimen at a first speed. When the specimen is a predetermined distance from the reflective surface of the ATR objective, the controller causes the z-axis stage to move toward the reflective surface at a second speed while forming approach images of the reflective surface to determine if the specimen is in contact with the reflective surface.

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Santa Clara, CA, United States of America

Matthew Kole