Intel Corporation

Matthew Fife

Kristoffer Fleming

Jianfang Olena Zhu

Daniel J Ragland

Yifan Li

Jin Yan

Mark Macdonald

Hui Xiong

Rodny Rodriguez

Felipe Gonzalez

Apparatus, systems, and methods for intelligent tuning of overclocking frequency are disclosed. An example apparatus includes trial control circuitry to execute an optimization model to select first values for overclocking parameters of a processor, the first values associated with a first trial, and perform benchmark testing of the processor when the processor is operating based on the first values; trial evaluation circuitry to calculate a first score for the first trial based on the benchmark testing; and model updating circuitry to perform a comparison of the first score to a second score, the second score associated with a second trial for second values for the overclocking parameters, the second values different than the first values; and select one of the first values or the second values to overclock the processor based on the comparison.

Apparatus, systems, and methods for intelligent tuning of overclocking frequency

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Portland, OR, United States of America

Matthew Fife