Olympus Ndt

Olympus Scientific Solutions Americas Corp.

Matthew Edward Stanton

Steven Abe LaBreck

C Tricia Liu

Daniel Stephen Kass

Ernest Bill

Thomas J Nelligan

Disclosed is a flexible coil circuit for a non-destructive inspection probe. The coil circuit is made of multiple layers of thin flexible ceramic material, each ceramic layer having a metallization layer deposited thereon. The circuit is capable of continuous operation at temperatures up to 350&#xb0; C. The metallized layers are able to slide freely over one another as the probe is flexed, enabling the probe to conform to the circumference of pipes as small as 2 inches in diameter.

Flexible ceramic coil circuit for high temperature non-destructive inspection

An adjustable probe holder assembly is disclosed for an inspection or measurement sensor, such as an ultrasound transducer, eddy current sensor, magnetic thickness sensor or optical image sensor, in order to position the sensor in a confined space using an extended arm with an adjustable curvature. The probe holder has at least two elongated holding arms, among which a first arm and a second arm, each having a probe end and a holding end, wherein the probe end of each of the holding arms are attached to the probe and the at least two arms remain substantially parallel and very close to each other when the probe holder is at a non-operational status. The two arms bulge open away from each other due to either a tension force or a compression force being exerted along the longitudinal direction of either one of the arms, holding the probe to be against the test surface of the test object.

Adjustable probe holder assembly for an inspection sensor

Disclosed is a Hall sensor probe that configured to be coupled with one of a plurality of magnetic targets for measuring the thickness of a non-ferromagnetic wall. The probe comprises a magnetic field source, a Hall sensor, a concentrator and a main housing. The novel aspects of the probe include a wear tip that is exchangeably affixed onto the main-housing, leaving a permanent gap from and disjoined from the concentrator in a manner that transfers stress from the tip directly onto the main-housing. To serve every aspects of the primary objective, being it mechanical, thermal and operational, the material of the tip preferably has a fracture toughness higher than 20 MPa&#xb7;m, wear coefficient higher than 100, and a magnetic susceptibility lower than 0.001.

Hall effect probe with exchangeable wear tips

Disclosed is a wear plate assembly for NDT/NDI probes which provides sufficient protection for the probe being wrung against test objects, desirable acoustic performance meeting the requirements for versatile ultrasonic inspections while providing a mechanism that allows the transducer to be put into or taken out conveniently. The wear plate protects probes from being pieced, worn or structurally deformed albeit being thinner than a wavelength of the acoustic echoes.

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Reading, MA, United States of America

Matthew Edward Stanton