General Electric Company

Matthew Edward Dragovich

Patrick Joseph Howard

Joseph James Lacey

Francis Howard Little

Toby George Darkins, Jr

Robert August Kaucic

Harry Israel Ringermacher

Donald Robert Howard

Yanyan Wu

Xiaodong Tao

Joshua Brian Jamison

Zhaohui Harry Sun

Joseph Manuel Portaz

Eric Scott Foster

A system comprises an energy source and detector. The energy source is configured to emit energy from a focal spot. The detector comprises an array of pixels. Each of the pixels of the array of pixels has a centerline extending longitudinally through the pixel. The centerline of each pixel is focally aligned with the focal spot of the energy source. Each of the pixels receives selected amounts of the energy from the energy source that have passed through an object.

Detector with focally aligned pixels

A method and system for nondestructively detecting and quantifying material anomalies within materials, including composite articles. The method entails performing a three-dimensional imaging scan technique, such as a computed tomography scan, of the material and a reference standard such that a test image of the material and a reference image of the reference standard appear in a plurality of two-dimensional scan views generated by the scan technique. The reference images are located in the scan views and normalized to determine at least an average value of the pixel data for the reference images. Values of pixel data of the test image are determined in each scan view, and then compared to the pixel data of the reference images to detect the presence of an anomaly in the test images. The detected anomaly in at least one of the test images of the scan views is then compared to a requirement standard for the material.

Nondestructive inspection method and system

A method for determining 3D distances on a 2D pixelized image of a part or object includes acquiring a real 2D pixelized image of the object, creating a simulated image of the object using the 3D CAD model and the 2D pixelized image, determining a specified cost function comparing the simulated image with the real 2D pixilated image and repositioning the simulated image in accordance with iterated adjustments of a relative position between the CAD model and the 2D pixilated image to change the simulated image until the specified cost function is below a specified value. Then, the workstation is used to generate a 3D distance scale matrix using the repositioned simulated image, and to measure and display distances between selected pixels on a surface of the real image using 2D distances on the 2D pixelized image of the object and the 3D distance scale matrix.

Methods and apparatus for measuring 3D dimensions on 2D images

Growing community of inventors

West Chester, OH, United States of America

Matthew Edward Dragovich