Intel Corporation

Matthew B Pedersen

Walid M Hafez

Kevin X Zhang

Zhanping Chen

Zhiyong Ma

Sarvesh H Kulkarni

Xianghong Tong

Kevin D Johnson

Jason Sandri

Charles A Peterson

Monib Ahmed

Ian S Walker

Horaira Abu

Brian Harris

Jason G Sandri

In accordance with some embodiments, the way in which the fuses are sensed and, particularly, their order may be made more random so that it is much more difficult to simply exercise the device and determine all the values of the storage elements within the fuse array. One result is a more secure storage device.

Random fuse sensing

Methods of forming and using a microelectronic structure are described. Embodiments include forming a diode between a metal fuse gate and a PMOS device, wherein the diode is disposed between a contact of the metal fuse gate and a contact of the PMOS device, and wherein the diode couples the contact of the metal fuse gate to the contact of the PMOS device.

Methods of forming secured metal gate antifuse structures

Growing community of inventors

Beaverton, OR, United States of America

Matthew B Pedersen