Eospace Inc.

Matthew Allen Hall

David Emil Moilanen

The invention introduces a new RF test and measurement methodology based on optical signal processing that has the capability to measure all of the RF parameters (both amplitude and phase) of an electronic component or system including transmission (S) and reflection (S). It can also be applied to measuring the electro-optic properties of electro-optic modulators, both phase modulators and intensity modulators. The basis of the invention is to use the RF information encoded in the optical sidebands generated by an electro-optic modulator to determine all of the relevant parameters of an electronic or electro-optic device. Optical carrier suppression techniques are used to isolate the information carrying optical sidebands from the dominant optical carrier.

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Chicago, IL, United States of America

Matthew Allen Hall