Prismatic Sensors Ab

Sectra Mamea Ab

Other

Mamea Imaging Ab

University of California

Planet Earth Razors Ab

Innovicum Technology Ab

Ge Precision Healthcare LLC

Philips Digital Mammography Sweden Ab

Mats Danielsson

David Michael Hoffman

Daniel Säll

Cheng Xu

Staffan Karlsson

Martin Sjolin

Xuejin Liu

Torbjörn Hjärn

Mats Persson

Jakob Wikner

Mietek Bakowski Holtryd

Hans Bornefalk

Christer Svensson

Jacob J Wikner

Anders Brahme

Martin Sjölin

Rolf Behling

Shlomo Zucker

Magnus Hemmendorff

Erik Fredenberg

Fredrik Grönberg

David R Nygren

Mark Rutland

Mats Lundqvist

Bjorn Cederstrom

Christel Sundberg

Robert Cahn

Kathryn Harris

Sam Hacohen

Jonas Vestlund

Anders Björklid

Torbjörn Hjarn

Johannes Loberg

Ben Huber

Han Chen

Sandra Tibbelin

Theresa Lammroth

Lénnart Rapp

Rolf Eriksson

Filip Bergentoft

Martin SJÖLIN

Anders BJÖRKLID

Torbjörn HJÄRN

Markus Wahlberg

Disclosed is an X-ray sensor having an active detector region including detector diodes on its surface. The X-ray sensor further includes a junction termination surrounding the surface region including the detector diodes. The junction termination includes a guard arranged closest to the end of the surface region, a field stop outside the guard and at least two field limiting rings, FLRs arranged between the guard and the field stop. A first FLR is arranged at a distance Δfrom the guard selected from the interval [4 μm; 12 μm], a second FLR is arranged at a distance Δfrom the first FLR selected from the interval [6.5 μm; 14 μm], and wherein the distance Δis larger than the distance Δ. The proposed technology also provides a method for constructing such an X-ray sensor and an X-ray imaging system including an X-ray detector system that includes such X-ray sensor.

X-ray sensor having a field limiting ring configuration

An X-ray source () comprise a microparticle source () configured to generate a particle stream () of spatially separated and moving, solid and/or liquid microparticles. The X-ray source () also comprises an electron source () configured to generate an electron beam () of electrons incident onto the particle stream () at an interaction region () to excite solid and/or liquid microparticles in the interaction region () to generate X-rays ().

Particle based X-ray source

A method for re-coating a razor blade () of a razor cartridge () comprises removing the razor blade () attached to a blade support () from a housing () of the razor cartridge (). The method also comprises inducing a relative movement between a PTFE material and an edge () of the razor blade () attached to the blade support () to deposit PTFE onto at least a portion of a surface of the edge () of the razor blade () to form a re-coated razor blade () attached to the blade support (). The method further comprises arranging the re-coated razor blade () attached to the blade support () into a housing () of a razor cartridge (). A device () for re-coating a razor blade () is also disclosed.

Razor blade re-coating

An x-ray imaging system includes an x-ray source and detector. The detector is a photon counting x-ray detector, enabling detection of photon-counting events. The system acquires at least one phase contrast image based on photon-counting events. The detector includes x-ray detector sub-modules, also referred to as wafers, each including detector elements. The sub-modules are oriented in edge-on geometry with their edge directed towards the x-ray source, assuming the x-rays enter through the edge. Each sub-module or wafer has a thickness with two opposite sides of different potentials to enable charge drift towards the side, where the detector elements/pixels, are arranged. The system estimates charge diffusion from a Compton interaction or an interaction through photoeffect related to an incident x-ray photon in a sub-module or wafer of the x-ray detector, and estimates a point of interaction of the x-ray photon sub-module based on the determined estimate of charge diffusion.

X-ray imaging system for phase contrast imaging using photon-counting events

An x-ray imaging apparatus includes an x-ray source and detector with multiple detector elements. The source and detector are on a support that rotates around a subject, enabling projections at different view angles. The apparatus operates the x-ray source in switched kVp mode for alternately applying different voltages, including lower and higher voltages, during rotation to enable lower-energy and higher-energy exposures over the projections, providing for lower-energy projections and higher-energy projections. The x-ray detector is a photon-counting multi-bin detector allocating photon counts to multiple energy bins, and the apparatus selects counts from at least a subset of the bins to provide corresponding photon count information for both lower- and higher-energy projections. The apparatus performs material basis decomposition for some of the lower-energy projections and higher-energy projections and/or for some combinations of at least one lower-energy projection and at least one higher-energy projection, based on the corresponding photon count information.

Enhanced spectral x-ray imaging

The disclosed method enables estimating an initial point of interaction of an x-ray photon in a photon-counting x-ray detector, based on a number of x-ray detector sub-modules or wafers, each including detector elements. The x-ray detector sub-modules are oriented in edge-on geometry with the edge directed towards the x-ray source, assuming the x-rays enter through the edge. Each detector sub-module or wafer has a thickness with two opposite sides of different potentials to enable charge drift towards the side, where the detector elements, also referred to as pixels, are arranged. Basically, the method includes: determining an estimate of charge diffusion originating from a Compton interaction or an interaction through photoeffect related to the x-ray photon in a detector sub-module or wafer of the x-ray detector; and estimating the initial point of interaction along the thickness of the detector sub-module based on the determined estimate of charge diffusion.

Enabling estimation of an initial point of interaction of an x-ray photon in a photon-counting x-ray detector

An edge-on photon-counting detector includes at least one detector module having a respective edge facing incident X-rays. The at least one detector module includes a semiconductor substrate. The edge-on photon-counting detector also includes a plurality of active integrated pixels arranged in the semiconductor substrate.

Edge-on photon-counting detector

There is provided an arrangement including an x-ray detector arranged in conjunction with in-line x-ray focusing optics configured for manipulation of x-rays in medical transmission radiography, wherein the in-line x-ray optics includes an array of lenses, in which the lenses cover parts of, or the entire, field of view, and in which the x-ray detector is a photon-counting detector. Furthermore, the x-ray detector is an energy-resolving detector and chromatic aberration of the lens array and/or limited coherence of the source is compensated for by the energy resolution of the energy-resolving detector, and/or the x-ray detector is a depth-resolving detector and chromatic aberration of the lens array and/or limited coherence of the source is compensated for by depth resolution or volumetric resolution in the detector.

In-line x-ray focusing optics used for manipulation of x-rays in medical transmission radiography

There is provided a photon-counting x-ray detector system () comprising a plurality of photon-counting channels (), and at least one anti-coincidence circuit (), each of which is connected to least two of the channels and configured to detect coincident events in the connected channels. The x-ray detector system () further comprises an anti-coincidence controller () configured to control the operation of said at least one anti-coincidence circuit based on photon count information by gradually adapting the operation of said at least one anti-coincidence circuit with increasing count rates, starting from a threshold count rate.

Photon-counting x-ray detector system having an adaptive anti-coincidence system

An X-ray sensor () having an active detector region including a plurality of detector diodes () arranged on a surface region () of the X-ray sensor (), a junction termination () surrounding the surface area () including the plurality of detector diodes (), the junction termination () including a guard () arranged closest to the end of the surface region (), a field stop () arranged outside the guard () and a number N of field limiting rings, FLRs () arranged between the guard () and the field stop (), wherein each of the FLRs () are placed at positions selected so that distances between different FLRs () and between the guard and the first FLR lie within an effective area, the effective area being bounded by the lines &#x3b1;=(10+1.3&#xd7;(n&#x2212;1)) &#x3bc;m and &#x3b2;=(5+1.05&#xd7;(n&#x2212;1)) &#x3bc;m.

X-ray sensor, method for constructing an x-ray sensor and an x-ray imaging system comprising such an x-ray sensor

Disclosed is a method for management of geometric misalignment in an x-ray imaging system having an x-ray source, a photon-counting x-ray detector and an intermediate collimator structure in the x-ray path between the x-ray source and the x-ray detector. The x-ray detector includes a plurality of pixels, and the collimator structure includes a plurality of collimator cells, wherein each of at least a subset of the collimator cells corresponds to a N&#xd7;M matrix of pixels, where at least one of N and M is greater than one. The method includes monitoring, for a designated subset of pixels including at least two pixels that are affected differently by shadowing from the collimator structure due to geometric misalignment, output signals from the pixels of the designated subset, and determining the occurrence of geometric misalignment based on the monitored output signals from the pixels of the designated subset of pixels.

Managing geometric misalignment in x-ray imaging systems

There is provided a method and an arrangement for determining a position of interaction of a photon in an individual detector diode of a photon-counting x-ray detector. The method includes determining the position of interaction in the detector diode based on pulse characteristics of a pulse generated by the individual detector diode in response to the photon interaction.

Increased spatial resolution for photon-counting edge-on x-ray detectors

A photon-counting detector includes a first subset of detector modules and at least one second subset of detector modules. Each detector module has power-consuming circuitry. Power-consuming circuitry of detector modules in the first subset is configured, in an operational mode in which the detector modules are powered on, to consume a first amount of power. Correspondingly, power-consuming circuitry of detector modules in the at least one second subset is configured, in the operational mode, to consume a second amount of power that is lower than the first amount of power.

Photon counting detector

Disclosed is a photon-counting x-ray detector system having a plurality of photon-counting channels, and at least one anti-coincidence circuit, each of which is connected to least two of the channels and configured to detect coincident events in the connected channels. The x-ray detector system further includes an anti-coincidence controller configured to control the operation of the at least one anti-coincidence circuit based on photon count information by gradually adapting the operation of the at least one anti-coincidence circuit with increasing count rates, starting from a threshold count rate.

Disclosed is an edge-on photon counting detector and a method for manufacturing a charge collecting side of such detector. The edge-on photon counting detector comprises a semi-conducting substrate. The semi-conducting substrate comprises, a first end adapted to face an x-ray source and a second end opposite the first end in the direction of incoming x-rays, and at least one strip having N depth segments, N&#x2265;2, each of the depth segments comprising a charge collecting metal electrode and a charge collecting side comprising doped regions and insulating regions, wherein each of the charge collecting metal electrodes is arranged over a corresponding doped region and is connected to a respective routing trace arranged on the insulating regions, the respective routing trace being adapted to conduct signals from the charge collecting metal electrode to a read-out pad E, connectable to front-end electronics, arranged at the second end.

Detector for x-ray imaging

Growing community of inventors

Täby, Sweden

Mats Danielsson