Other

Mathias Hömig

Bernhard Sandkamp

Volker Heer

Burkhard Groh

An X-ray device () is provided including an X-ray source () and a first X-ray detector () for producing a first X-ray image data set of an examination object (P). A second X-ray detector () is provided for producing a second X-ray image data set of examination object (P) where the second X-ray detector () has a smaller detector surface () than the first X-ray detector (). The second X-ray detector () may produce an X-ray image associated with the second X-ray image data set that has a higher local resolution than the X-ray image () associated with the first X-ray image data set. The second X-ray detector () may be movably connected with the first X-ray detector () so the second X-ray detector () maybe articulated upstream of the first X-ray detector ().

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Erlangen, Germany

Mathias Hömig