Rohde and Schwarz Gmbh & Co. Kg

Mathias Hellwig

Andreas Maier

Bendix Koopmann

The present disclosure relates to an electronic instrument for analyzing a device-under-test, DUT, comprising: a digital signal generator configured to generate a test signal having a first frequency; a signal output unit which is connected to the DUT, wherein the signal output unit is configured to convert the test signal to an analog signal and to forward said signal to the DUT; a signal input unit which is connected to the DUT and which is configured to receive a DUT response signal which is based on the test signal, wherein the signal input unit is configured to digitalize the DUT response signal; a signal processing circuity configured to receive the digitalized DUT response signal and to downconvert said signal using the first frequency of the test signal; and an analyzing unit configured to analyze the downconverted DUT response signal in order to determine a transfer function, an impedance and/or a loop stability of the DUT.

Electronic instrument for analyzing a DUT

A signal analysis method is described. The signal analysis method includes: receiving a time-and-value discrete input signal, the input signal being associated with a signal source; determining at least one jitter component of the input signal; determining a step response based on the input signal, the step response being associated with at least the signal source; determining a counter function based on the step response, the counter function being configured to cancel error terms in a finite-time transform of the step response to frequency domain; superposing the step response and the counter function, thereby obtaining a modified step response; and transforming the modified step response to frequency domain, thereby obtaining a transfer function being associated with at least the signal source. Further, a signal analysis module for analyzing a time-and-value discrete input signal being associated with a signal source is described.

Signal analysis method and signal analysis module

The present disclosure relates to a method of reducing a noise induced signal drift. The method comprises: receiving an input signal; recording a waveform of the input signal; and determining an antiderivative of the waveform by optimizing a derivative of the antiderivative to be determined and an absolute deviation of the antiderivative to be determined. Further, the present disclosure relates to a test instrument for analyzing an input signal.

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Munich, Germany

Mathias Hellwig