Litepoint Corporation

Mathew Philip

Christian Volf Olgaard

Ruizu Wang

Erdem Serkan Erdogan

The invention described herein utilizes devices under test (DUTs) outfitted with stored, predefined test sequences, testers equipped with vector-signal generation (VSG) and vector-signal analysis (VSA) functionality, and novel methods for combining loopback and single-ended test functions in order to obtain higher testing efficiency for DUTs using Bluetooth or other time-division duplex (TDD) based communications.

Method for efficient parallel testing of time division duplex (TDD) communications systems

System and method for facilitating testing of multiple data packet signal transceivers involving data-packet-signal replication and one or more status signals indicating successful and unsuccessful receptions of confirmation signals. Based upon the one or more status signals, one or more control signals cause the replicated data packet signals to be distributed to the devices under test (DUTs) such that, following successful and unsuccessful receptions of confirmation signals, corresponding replicated data packet signals are caused to fail to conform in part or to conform, respectively, with a predetermined data packet signal standard.

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Palo Alto, CA, United States of America

Mathew Philip