Sony Corporation

Matatoshi Honjo

Tetsuya Yamamoto

Yasushi Fujinami

Kenichi Nakanishi

Ken Ishii

Hideaki Okubo

Tsunenori Shiimoto

Tatsuo Shinbashi

Haruhiko Terada

Hiroyuki Iwaki

Detecting a defective cell in a memory in consideration of an error property difference depending on the storage state. A determination unit determines whether there is a possibility of defect for each of unit-of-storages on a memory cell formed with a non-volatile memory. The non-volatile memory undergoes either a reset operation that transitions a state from a low resistive state (LRS) to a high resistive state (HRS) or a set operation that transitions the state from the high resistive state to the low resistive state. The determination unit determines a unit-of-storage in which the number of errors in predetermined one of the reset operation and the set operation has exceeded a predetermined standard, as a unit-of-storage suspected of having a defect.

Storage control apparatus, storage apparatus, and storage control method

Growing community of inventors

Tokyo, Japan

Matatoshi Honjo