Microtracbel Corp.

National Institute of Advanced Industrial Science and Technology

Waseda University

Masayuki Yoshida

Kazuyuki Nakai

Akira Endo

Masahiko Matsukata

Marie Shimomura

Satoshi Taniguchi

Makoto Okawa

An adsorption characteristic measuring apparatus is configured to: acquire a unit-time leak pressure value from a pressure increase value of an internal pressure value of a sample tube caused by an non-adsorption gas leaking from the outside of a fitting portion into an inner space of the sample tube; acquire a pressure value at which a temporal change of the internal pressure value of the sample tube assumes an equilibrium state when an adsorption gas present in the reference volume portion is supplied into the sample tube and the sample tube is in a closed state; calculate a pressure value after correction of a real leak pressure value is performed on a measured equilibrium pressure value, as a true equilibrium pressure value, the real leak pressure value being obtained in such a manner that the unit-time leak pressure value is multiplied by a leak time; and calculate an adsorption isotherm.

Adsorption characteristic measuring apparatus

An adsorption characteristic measuring apparatus according to the invention supplies a predetermined adsorption gas to a film formed body as a sample accommodated in a sample tube to measure adsorption characteristics. In the inside of the sample tube, a void between an inner wall surface of the sample tube and the sample is filled with a particle-like filler having higher thermal conductivity than the adsorption gas under a measurement pressure. In addition, a glass rod as a dead volume reducing rod, a spacer ring for forming a thermal insulation space between the particle-like filler and the glass rod, and a reflective plate for reflecting radiant heat are disposed.

Growing community of inventors

Toyonaka, Japan

Masayuki Yoshida