Anritsu Corporation

Masayuki Shinohara

Taichi Murakami

Yasuhiro Miyake

An end face inspection apparatus which inspects an end face of an test object, and includes optical system causing an image acquisition unit to form an image of an end face of a held test object, focusing degree changing means for changing a distance between the end face of the test object and a focal position of the optical system, and a control unit processing image data acquired in the image acquisition unit. The end face inspection apparatus acquires a series of image data which is output from the image acquisition unit at a preset time interval while the distance between the end face of the test object and the focal position of the optical system is changed, determines whether or not each piece of the image data is focused, and selects focused image data as image data for end face inspection.

Growing community of inventors

Kanagawa, Japan

Masayuki Shinohara