Nec Corporation

Renesas Electronics Corporation

Elpida Memory, Inc.

Sony Corporation

Leland Stanford Junior University

Ihi Corporation

Janiftec, Inc.

Masayuki Mizuno

Koichi Nose

Haruya Ishizaki

Shunichi Kaeriyama

Masakazu Yamashina

Yoshio Kameda

Hiroaki Ikeda

Hiroaki Inoue

Yoshihiro Nakagawa

Kayoko Shibata

Atsufumi Shibayama

Yasuhiko Hagihara

Muneo Fukaishi

Masamichi Takagi

Hideaki Saito

Makoto Takamiya

Koichiro Noguchi

Koichiro Minami

Hidetoshi Ikeda

Eisuke Saneyoshi

Yasushi Ooi

Kenichiro Anjo

Yutaka Yokoyama

Masayuki Furumiya

Hiroaki Ohkubo

Keishi Ohashi

Koichiro Furuta

Fuyuki Okamoto

Yasutaka Kotani

Kenichi Nishi

Mikihiro Kajita

Toru Nakura

Kenji Koga

Masaru Morita

Yoshitaka Nadachi

Junichi Goto

Takaharu Hashimoto

Toshinobu Ono

Shu-Yu Zhu

Youichi Koseki

Tomofumi Iima

Terumasa Ishihara

A wireless communication system includes a first radio equipment that transmits first data using a first radio wave; a data transmitter that transmits a second radio wave, the second radio wave causing a disturbance on the first radio wave according to second data to be transmitted; and a second radio equipment that demodulates the first data transmitted from the first radio equipment, and demodulates the second data transmitted from the data transmitter using a variation in a bit error rate of communication between the first radio equipment and the second radio equipment, wherein the data transmitter includes a first antenna that receives the first radio wave; an input amplifier that amplifies a signal corresponding to the first radio wave received by the first antenna; and an oscillator that is supplied with an output from the input amplifier, and oscillates at the same frequency as that of the first radio wave.

Wireless communication system and data transmitter

A wireless communication system according to an embodiment includes a first radio equipment that transmits first data using first radio waves, a data transmitter that transmits a second radio wave for causing a disturbance on the first radio wave according to second data, and a second radio equipment that modulates the first data transmitted from the first radio equipment, and modulates the second data transmitted from the data transmitter using a variation in a bit error rate of communication between the first radio equipment and the second radio equipment. The data transmitter includes an amplifier that amplifies a signal corresponding to the first radio wave received by a first antenna, and a feedback element that feedbacks a signal from an output node of the amplifier to an input node of the amplifier, and forms a feedback loop.

Provided is a wireless communication system including a first radio equipment that transmits first data using first radio waves, a data transmitter that outputs a second radio wave generated by modulating the first radio wave according to second data to be transmitted, and a second radio equipment that receives the first radio wave and the second radio wave, and separates and demodulates the first data transmitted from the first radio equipment and the second data transmitted from the data transmitter contained in the received radio waves.

Wireless communication system, wireless communication method, radio equipment, and data transmitter

Disclosed is a radio communication system capable of reducing the cost for introducing a system utilizing RFID technology into a radio network environment. A radio communication system pertaining to the present invention includes a first radio equipment that transmits first data using a first radio wave; a data transmitter that outputs a second radio wave generated by modulating the first radio wave depending on second data which is an object for transmission; and a second radio equipment that receives the first and second radio waves and includes a separation and demodulation circuit that separates and demodulates the first data transmitted from the first radio equipment and the second data transmitted from the data transmitter included in the received radio waves. The data transmitter includes an amplifier for generating the second radio wave by amplifying the first radio wave.

Radio communication system, radio communication method, and data transmitter

A redundant computing system is composed of two systems: a first arithmetic processing unit (A-system) and a second arithmetic processing unit (B-system) having the same functions. A diagnosis control unit performs diagnosis of one system while the other system is performing arithmetic processing operation. The diagnosis control unit controls the input to the first and second arithmetic processing units by way of an input control unit according to the diagnosis operation, and an output control unit controls the output from the first and second arithmetic processing units according to the diagnosis result. After termination of the diagnosis, a value is copied from a storage unit of the system which has not been diagnosed to a storage unit of the system which has been diagnosed, and the redundant computing system resumes the redundant operation.

Redundant computing system and redundant computing method

There is provided an aging diagnostic device including: a reference ring oscillator () that constitutes a ring oscillator using an odd-numbered plurality of logic gates constituted using a CMOS circuit; a test ring oscillator () that constitutes a ring oscillator using an odd-numbered plurality of logic gates having the same configuration as that of the logic gate; a load unit () that inputs a load signal to the test ring oscillator (); a control unit () that simultaneously inputs a control signal instructing a start of oscillation of the reference ring oscillator () and the test ring oscillator () to the reference ring oscillator () and the test ring oscillator (); and a comparison unit () that compares differences in the amount of movement of pulses within the reference ring oscillator () and the test ring oscillator (), respectively, in the same time.

Aging diagnostic device, aging diagnostic method

A signal measuring device, comprises one set, or a plurality of sets, of measuring unit(s) measuring an object of measurement in synch with a driving clock signal for measurement and outputting result of measurement as first data, and a timing identification unit which, in accordance with a measurement-start command, outputs a value, which differs every period, as second data in synch with a reference signal having a prescribed period and a speed lower than that of the driving clock signal; and a storage unit collecting and successively storing the first data and the second data as one set in synch with the driving clock signal.

Signal measuring device and signal measuring method

A semiconductor device () includes a semiconductor wafer () on which a plurality of semiconductor chip forming regions (A) is formed, a circuit section () which is provided within each of the semiconductor chip forming regions (A) of the semiconductor wafer (), a control circuit section (), provided within each of the semiconductor chip forming regions (A) and connected to the circuit section (), that controls electric power supplied to the circuit section (), a power supply line () connected to the plurality of control circuit section (), and a reference power line () connected to the plurality of control circuit section (). In each of the control circuit sections (), a voltage of electric power supplied from the power supply line () is controlled on the basis of a reference voltage from the reference power line ().

Semiconductor device and method of testing the same

A semiconductor integrated circuit device includes: a normal output signal counter that counts number of times a normal output signal is output by the circuit under test in response to a preset one of the input signals of the input signal set, in case where a circuit under test repeats processing on each of one or more input signals of an input signal set sequentially, a plural number of times.

Semiconductor integrated circuit device with test circuit and test method therefor

Current reading means detects an output current of a current source whose output current varies with a variation in temperature and outputs a value proportional to the output current. The temperature of the current source corresponding to the output value of the current reading means which is proportional to the output current of the current source is measured, and a parameter for converting the output value to temperature information is determined from the output value of the current reading means and the measured value of the temperature of the current source corresponding to the output value. The output value of the current reading means is converted to the temperature information using the determined parameter.

Temperature measuring device and method

A semiconductor test apparatus, semiconductor device, and test method are provided that enable the realization of a high-speed delay test. Semiconductor test apparatuses (-) include: flip-flops () each provided with first input terminal SI, second input terminal D, mode terminal SE that accepts a mode signal indicating either a first mode or a second mode, clock terminal CK that accepts a clock signal, and output terminal Q, the flip-flops () selecting first input terminal SI when the mode signal indicates the first mode, selecting second input terminal D when the mode signal indicates the second mode, and holding information being received by the input terminal that was selected based on the mode signal in synchronization with the clock signal and supplying as output from output terminal Q; and hold unitthat holds a set value and that provides the set value to first input terminal SI.

Semiconductor testing device, semiconductor device, and testing method

Even if a multiprocessor includes an uneven performance core, an inoperative core or a core that does not satisfy such a performance as designed but if the contrivance of task allocation can satisfy the requirement of an application to be executed, the multiple processors are shipped. In a task group allocation method for allocating, to a processor having a plurality of cores, task groups included in an application for the processor to execute, a calculation section measures performances and disposition patterns of the cores, generates a restricting condition associating the measured performances and disposition patterns of the cores with information indicating whether the application can be executed, and, with reference to the restricting condition, reallocates to the cores, the task groups that have previously been allocated to the cores.

Allocating task groups to processor cores based on number of task allocated per core, tolerable execution time, distance between cores, core coordinates, performance and disposition pattern

A plurality of semiconductor chips are juxtaposed, each having an electromagnetic induction coil disposed thereon. A signal is transmitted by way of electromagnetic induction between the electromagnetic induction coils disposed on a pair of adjacent semiconductor chips.

Semiconductor device

Spectrum measurement circuit () includes: N-(where N is integer equal or greater than 2) phase clock generation circuit () for supplying phase-modulated signals in which the phase of a clock signal is shifted by a phase modulation amount each time the settings of the phase modulation amount are switched; mixer circuit () for taking the product of a measured signal supplied from a transmitter and the phase-modulated signals supplied from N-phase clock generation circuit (); average value output circuit () for supplying an average voltage value of the output signal of mixer circuit (); memory () for storing the average voltage value supplied from average value output circuit () for each phase modulation amount of N-phase clock generation circuit (); and arithmetic unit () for using the average voltage value for each phase modulation amount of N-phase clock generation circuit () to calculate the signal strength of the measured signal.

Signal quality measurement device, spectrum measurement circuit, and program

A semiconductor device includes a semiconductor wafer in which semiconductor chip forming regions and a scribe region located between the semiconductor chip forming regions are formed, a plurality of semiconductor chip circuit portions provided over the semiconductor wafer, a plurality of first conductive layers, provided in each of the semiconductor chip forming regions, which is electrically connected to each of the circuit portions, and a first connecting portion that electrically connects the first conductive layers to each other across a portion of the scribe region. An external power supply or grounding pad is connected to any one of the first conductive layer and the first connecting portion. The semiconductor device includes a communication portion, connected to the circuit portion, which performs communication with the outside by capacitive coupling or inductive coupling.

Growing community of inventors

Tokyo, Japan

Masayuki Mizuno