Omron Corporation

Masayuki Masuda

Tsuyoshi Matsunami

Haruyuki Koizumi

Shinji Sugita

Kiyoshi Murakami

Noriyuki Kato

Masanori Kadowaki

Yoshiyuki Nagao

Toshimi Kudo

Yasushi Sasaki

An X-ray inspecting apparatus capable of high-speed inspection of a prescribed inspection area of an object of inspection is provided. The X-ray inspecting apparatus includes: a scanning X-ray source for outputting X-ray; an X-ray detector driving unit on which a plurality of X-ray detectors are mounted, and capable of driving the plurality of X-ray detectors independently; and an image acquisition control mechanism controlling acquisition of image data by X-ray detector driving unit and X-ray detectors. A scanning X-ray source emits X-ray while moving the X-ray focal point of the X-ray source to each of X-ray emission originating positions set for each X-ray detector such that the X-ray passes through a prescribed inspection area of an object of inspection and enters each X-ray detector. Image pick-up by some of the X-ray detectors and movement of other X-ray detectors to an image pick-up position are executed in parallel and alternately. An image acquisition control unit acquires the image data picked-up by X-ray detectors, and a computing unit reconstructs an image in the inspection area based on the image data.

X-ray inspecting apparatus and X-ray inspecting method

An X-ray inspection apparatus includes a scanning X-ray source for emitting an X-ray, an X-ray detector drive unit having a plurality of X-ray detectors mounted thereon and being capable of independently driving the plurality of X-ray detectors, and an image acquisition control mechanism for controlling the X-ray detector drive unit and acquisition of image data from the X-ray detectors. The scanning X-ray source emits an X-ray by moving an X-ray focal point position of the X-ray source to each of originating point positions of X-ray emission, which are set for the X-ray detectors such that X-rays are transmitted through a plurality of prescribed inspection areas of an inspection object and enter the X-ray detectors. Image pickup by the X-ray detector and movement of another X-ray detector are concurrently performed in an alternate manner. The image acquisition control mechanism acquires image data, and an operation unit reconstructs an image.

X-ray inspection apparatus and X-ray inspection method

An X-ray examination apparatus includes a scanning X-ray source for outputting X-rays, a sensor base which is attached with a plurality of X-ray sensors and which rotates about a rotation axis, and an image acquiring control mechanism for controlling rotation angle of the sensor base and acquisition of image data from the X-ray sensors. With respect to each X-ray sensor, the scanning X-ray source moves the X-ray focal position of the X-ray source to each starting position of the X-ray emission set so that the X-ray transmits through a predetermined examination area of an examination target and enters each X-ray sensor, and emits the X-rays. The image control acquiring control mechanism acquires image data detected by the X-ray sensors, and a calculation unit reconstructs an image of the examination area based on the image data.

X-ray examination method and X-ray examination apparatus

An X-ray examination apparatus changes a position of each X-ray sensor by rotating a sensor base, and resets a starting position of X-ray emission that becomes a X-ray focal position so that the X-ray enters each X-ray sensor after the position thereof is changed. A scanning X-ray source deflects an electron beam to easily change the position where the electron beam impinges a target of the X-ray source to an arbitrary location. The irradiating position of the electron beam then can be easily moved according to an accumulated irradiation time on the target. Therefore, maintenance can be performed without interrupting the X-ray examination.

X-ray examination apparatus and x-ray examination method using the same

A system is formed with a controller that is connected to and is adapted to control devices. A tool is attachable to the controller and functions to create control program for specifying the device by an object name, to create correlation data for correlating the control program with device data on the device, and to download the correlation data to the controller.

Tool attachable to controller

A controller contains an I/O memory and uses a device detecting service to detect a device connected to it through a network and to obtain its device identifying data. A memory map setting service sets a device data area on the I/O memory according to the obtained device identifying data for exchanging data with the connected device and produces a memory map correlating the device data area with a variable data area on the I/O memory correlated to the device. The controller also includes a cyclic service and a data transmission service. The cyclic service transmits and receives data to and from the device periodically in the data linking format according to the memory map and by using the device data area on the I/O memory. The data transmission service transmits the data between the variable data area and the device data area.

System for transmitting data between a device data area and a variable data area of a memory according to a memory map based on an identifying data of a device detected

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Nishinomiya, Japan

Masayuki Masuda