Mitutoyo Mfg. Co., Ltd.

Masayuki Kuwata

Yoshiharu Kuwabara

Hiroyoshi Hamada

In a photoelectric type measuring method and device wherein a workpiece to be measured is scanned by parallel scanning ray beams for scanning in one direction, aforesaid ray beams after the scanning are received by light receiving elements and a time length of a dark portion or a bright portion generated due to the obstruction of a portion of the ray beams by workpiece to be measured in response to output signals from the light receiving elements is detected so as to obtain the dimension in the scanning direction of the workpiece to be measured, the aforesaid ray beams are split into ray beams polarized in directions different from each other, the workpiece to be measured is scanned in such a condition that the two ray beams are relatively shifted so that the two ray beam may be partially overlapped in the scanning directions thereof and light receiving signals corresponding to the two ray beams after the scanning are processed to detect and edge of the workpiece to be measured.

Photoeletric type measuring method and device

An optical measuring device comprising a parallel scanning ray beam generator, condensing means for condensing said parallel scanning ray beams after said parallel scanning ray beams have passed through a workpiece being measured, and a single light receiving element for sensing the brightness of said scanning ray beams condensed by said condensing means to convert the same into an electric signal, whereby the dimensions of the workpiece being measured are measured from the time length of a dark portion or a bright portion generated due to the obstruction of said parallel scanning ray beams by the workpiece being measured, which has been interposed between the parallel scanning ray beam generator and said light receiving element, a plurality of light emitting elements are arranged in opposed relations to the scanning scope of the parallel scanning ray beams, an output from the light receiving element during a single scanning time is time-shorn in accordance with the number of the light emitting elements to thereby cause the light emitting element or elements to emit light in accordance with the position of the workpiece being measured with respect to the scanning scope.

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Kanagawa, Japan

Masayuki Kuwata