Sii Nanotechnology Inc.

Masayuki Iwasa

Kazutoshi Watanabe

Masatsugu Shigeno

Kazunori Ando

Hiroumi Momota

In a local softening point measuring apparatus and thermal conductivity measuring apparatus using a probe microscope as a base, environment of the proband a sample surface is set to 1/100 atmospheric pressure (103 Pa) or lower. Otherwise, a side surface of the probe is coated with a thermal insulation material having a thickness that enables thermal dissipation to be reduced to 1/100 or lower, to thereby reduce the thermal dissipation from the side surface of the probe, and exchange heat substantially only at the contacting portion between the probe and the sample surface.

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Chiba, Japan

Masayuki Iwasa