Sysmex Corporation

Masayuki Ikeda

Hiroki Koike

Nobuhiro Kitagawa

Takashi Yamato

Masanori Imazu

Daisuke Nakano

Hironori Katsumi

Kazuya Fukuda

Tsuyoshi Fukuzaki

Yasuyuki Kawashima

Yousuke Tanaka

Takamichi Naito

A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selector for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount greater than the first amount; and a supply controller for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selector, is disclosed. A specimen analyzing method is also disclosed.

Specimen analyzing apparatus and specimen analyzing method

A specimen analyzing apparatus comprising: a detector for detecting component information regarding a component in a specimen contained in each of analyzing containers, the analyzing containers comprising first and second analyzing containers; an analyzing part for analyzing the component information detected by the detector; a transporting device for transporting specimen containers each containing a specimen, the specimen containers comprising first and second specimen containers; an operation mode selector for selecting one of a first operation mode and a second operation mode; a first supplying device for supplying the specimen of a first amount; a second supplying device for supplying the specimen of a second amount grater than the first amount; and a supply controller for controlling the first and second supplying devices in accordance with an operation mode selected by the operation mode selector, is disclosed. A specimen analyzing method is also disclosed.

A specimen analysis method, comprising: bringing a first specimen vessel to a sucking position for sucking specimens; obtaining a first measurement result of a first specimen contained in the first specimen vessel; bringing a second specimen vessel to the sucking position before the first measurement result is obtained; obtaining a second measurement result of a second specimen contained in the second specimen vessel; bringing a third specimen vessel to the sucking position after the first measurement result is obtained; obtaining a third measurement result of a third specimen contained in the third specimen vessel; and obtaining a fourth measurement result of the second specimen when the first measurement result is higher than a threshold, the second specimen being sucked at the sucking position again for obtaining the fourth measurement result before bringing the third specimen vessel to the sucking position, is disclosed. A specimen analysis is also disclosed.

Specimen analysis apparatus and specimen analysis method

An analyzer capable of operating in a normal processing mode performing sequential analysis of a plurality of specimens and in an interrupting mode performing analysis of an urgent specimen that comprising a suction unit for suctioning an urgent specimen, an analysis unit for analyzing an urgent specimen suctioned by the suction unit, an urgent specimen container holder for holding an urgent specimen container containing an urgent specimen, and a moving mechanism for moving the urgent specimen container holder between a placement position at which an urgent specimen container is placed in the holder, and a suction position at which an urgent specimen is suctioned from an urgent specimen container, wherein the moving mechanism comprises a movement force supplying mechanism for supplying a force to move the urgent specimen container holder from the suction position to the placement position is disclosed.

Analyzer

Sample analyzers for analyzing a sample are described that include a pipette for suctioning the sample; a sample preparation unit for preparing a measured sample by diluting the sample supplied by the pipette with an acidic solution; a pipette washing unit for washing the pipette with the acidic solution; a detection unit for obtaining a detection signal from the measured sample prepared by the sample preparation unit; and a controller for calculating an analysis result from the detection signal obtained by the detection unit. Bacteria analyzers for analyzing bacteria and solutions for use in sample analyzers are also described.

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Kobe, Japan

Masayuki Ikeda