International Business Machines Corporation

Masayuki Hayashi

John E Gersbach

Robert J Savaglio

Charles Joseph Masenas

Frank David Ferraiolo

Ilya I Novof

Richard F Keil

A process sort test circuit and methodology for determining performance characteristic of an IC chip. The circuit is located on an IC chip itself and comprises an input for receiving an input signal; a first path from the input to a first output for transmitting the input signal to the first output, the first path sensitive to variations in a manufacturing process for the IC chip; a second path from the input to a second output for transmitting the input signal to the second output, the second path being substantially less sensitive to the variations in the manufacturing process for the IC chip; and, a pulse generator device coupled to the first and second outputs for detecting a difference in arrival times of the input signal at the first and second outputs and for outputting a sort signal if the difference is of a preselected magnitude. The sort signal enables output indication of a performance characteristic of the IC chip.

On-demand process sorting method and apparatus

A shared path phase detector and phase indicator circuit provide a phase locked loop circuit for which loading and wiring dependencies are greatly reduced. The phase detector circuit is provided for receiving a reference clock and a second clock. The phase detector circuit provides a separate and unique signal for indicating the magnitude of the difference between the phase of the reference clock and the second clock, regardless of whether the second clock is leading or lagging the first clock. The phase indicator circuit detects whether the second clock is leading or lagging the first clock, and routes the pulses on a first internal signal path to generate either increment or decrement pulses depending on whether the second clock is lagging or leading, respectively. The generation of the increment and decrement pulses is also routed on the first internal signal path, which provides a phase locked loop circuit that does not require matched loading and custom wiring on the internal increment and the decrement paths as required in the prior art.

Shared path phase detector having phase indicator

A shared path phase detector circuit for receiving a reference clock and an oscillator clock, the phase detector circuit providing an output signal for indicating a magnitude difference between a phase of the reference and oscillator clocks. The output signal is independently derived from the leading or lagging edge relationship of the reference and oscillator clocks. The output signal does not describe which signal leads, but only the width magnitude difference. The design provides a single path over which the output signal travels, without feedback, such that the circuit dependencies are greatly reduced.

Shared path phase detector

A protective circuit for a phase lock loop ensures that the VCO does not initiate a runaway condition when outputting a signal having a frequency higher than the feedback divider can respond to. During normal phase lock operation, a counter keeps track of the PLL input signal and is reset by the feedback divider. In the runaway condition the counter is not reset and triggers a control signal to the VCO. A second counter can be used to keep track of the feedback divider output and to reset the first counter. When the first counter far outruns the second counter the control signal is triggered.

Anti-latching mechanism for phase lock loops

A switched capacitor, integrated circuit employing at least one non-linear capacitor charged and discharged in response to a reference frequency includes a first conductive device for charging the non-linear capacitor to the supply voltage in response to one polarity of the reference frequency, and a second conductive device for discharging the non-linear capacitor in response to the opposite polarity of the reference frequency to a voltage level opposite that of the voltage source minus the threshold voltage of a third conductive device in the discharge path. Preferably, a pair of non-linear capacitors are employed, each being charged on alternate half cycles of the reference frequency, and the non-linear capacitors are accumulator capacitors. The circuit also include means for rapidly initiating the charging and discharging of said capacitors and for precluding changes in the state of charge or discharge thereof due to parasitic diodes in the circuit.

Switched capacitor current source

Calibration systems and techniques for analog phase-lock loops (PLLs) providing the capability to dynamically maintain a constant damping factor. Damping factor is calibrated by automatically setting a reference bias current I.sub.r to the PLL's charge pump such that the charge current I.sub.c output therefrom maintains the desired PLL damping characteristic. The technique presented involves selecting a known first frequency F.sub.1 and allowing the PLL circuit to reach steady state, after which a known second frequency F.sub.2 is applied and the PLL circuit is monitored to determine whether steady state at this second frequency F.sub.2 is accomplished within a predetermined target time T.sub.x, which corresponds to the desired damping factor. The determination of whether lock occurs within the target time T.sub.x is then employed to automatically setting the reference current I.sub.r.

System and method for calibrating damping factor or analog PLL

According to the preferred embodiment, a self-biased phase-locked loop is provided that overcomes the limitations of the prior art bias methods and apparatus. In general, a self-biased current controlled semiconductor device, typically a current controlled oscillator, is self biased by the use of a first feedback path, typically provided by a phase-locked loop, where the feedback path provides a control current for controlling the current controlled device. A second feedback path, typically a pair current mirrors, serves as a bias loop having unity gain. The bias loop provides a bias current that is responsive to the control current. This device has the advantage of being self biasing, thus no other biasing circuitry is required.

Self-biased phase-locked loop

Calibration systems and techniques for analog phase-lock loops (PLLs) providing the capability to dynamically maintain a constant damping factor. Damping factor is calibrated by automatically setting a reference bias current I.sub.r to the PLL's charge pump such that the charge current I.sub.c output therefrom maintains the desired PLL damping characteristic. The technique presented involves selecting a known first frequency F.sub.1 and allowing the PLL circuit to reach steady state, after which a known second frequency F.sub.2 is applied and the PLL circuit is monitored to determine whether steady state at this second frequency F.sub.2 is accomplished within a predetermined target time T.sub.x, which corresponds to the desired damping factor. The determination of whether lock occurs within the target time T.sub.x is then employed to automatically set the reference current I.sub.r.

System and method for calibrating damping factor of analog PLL

A ring oscillator circuit which provides an output signal having a substantially constant, fifty (50%) percent duty cycle. The circuit includes a plurality of cascaded inverting stages, each of which has an input circuit for detecting an output voltage of a preceding inverting stage. One inverting stage provides a voltage to an output node. A clamping circuit, coupled to the output node, provides current to the output node whenever the instantaneous voltage output at the output node departs from a threshold voltage of a subsequent logic circuit. The current is such as to clamp the average voltage output to the threshold voltage. The plurality of cascaded inverting stages is coupled to power supply voltage across capacitor configured transistors. The ring oscillator circuit can be employed within a voltage controlled oscillator.

Ring oscillator circuit having output with fifty percent duty cycle

Calibration systems and techniques for phase-locked loops (PLLs) provide precise setting of the center frequency and/or uniform voltage controlled oscillator (VCO) gain characteristics. Center frequency is calibrated by imposing a selected center frequency at the output of the PLL and driving the control voltage V.sub.c across the PLL's filter to a predefined, steady state voltage indicative of PLL circuit calibration. The approach can be employed to calibrate any imposed VCO frequency output. VCO gain calibration is accomplished by employing the center frequency calibration technique only with a low frequency point imposed on the VCO output. A high frequency point on the transfer function is calibrated by applying a known voltage across the filter and driving the VCO output to a corresponding calibration frequency. Once a low frequency point and a high frequency point are calibrated, the slope of the VCO transfer function is defined. Various integrated PLL/calibration system embodiments are presented.

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Williston, VT, United States of America

Masayuki Hayashi