Sharp Kabushiki Kaisha Corporation

Masayuki Ehiro

Manabu Yumoto

Shunsuke Nagasawa

Shinsuke Anzai

Masayuki Miyamoto

Tsuyoshi Muramatsu

Shinichi Yoshida

Nobuyoshi Awaya

Hiroshi Tanaka

Kengo Takahama

Kiyoshi Kumata

Atsushi Aoki

Koji Inoue

Takashi Morisue

Yoshinori Tanida

Hideaki Sakaguchi

Masashi Shiomi

Masami Mori

Kazuomi Hatanaka

Katsuitsu Nishida

Kiyoharu Shimano

Kazuyuki Horinouchi

Akihiko Kuriyama

Teruaki Morita

Misao Takano

A touch panel system () includes a touch invalidating section () which, in a case where a specific point of the sensor panel () is continuously touched for a predetermined period of time, invalidates an instruction given, in accordance with the touch, to a host computer (). Furthermore, the touch invalidating section () invalidates an instruction corresponding to a next touch on the point.

Touch sensor system and electronic device

A touch panel system prevents an incorrect operation caused by an unintended contact of an object with a touch panel while suppressing a decline in sensitivity of detection of presence or absence of a touch on the touch panel. The touch panel system includes a touch invalidating section which, in a case where a specific point of a touch panel is continuously touched for a predetermined period of time, invalidates an instruction that is given, in accordance with the touch, to an electronic device including the touch panel.

Touch panel system and electronic device

A touch panel system () prevents an incorrect operation caused by an unintended contact of an object with a touch panel while suppressing a decline in sensitivity of detection of presence or absence of a touch on the touch panel. The touch panel system () includes a touch invalidating section () which, in a case where a specific point of a touch panel () is continuously touched for a predetermined period of time, invalidates an instruction that is given, in accordance with the touch, to an electronic apparatus including the touch panel ().

Touch panel system and electronic apparatus

The transmission liquid crystal display device includes a liquid crystal panel and a backlight, wherein the liquid crystal panel has pixels each of which is divided into four sub pixels as red (R), green (G), blue (B), and white (W) sub pixels. Further, an emission luminance of the backlight can be controlled.

Transmission liquid crystal display device

A portable data device includes: a first body including a display section, the first body having a first long side and a first short side; a second body housing a circuit section for controlling the display section, the second body having a second long side and a second short side; and a connecting member for connecting the first and second bodies. The portable data device has a first position in which the first and second bodies substantially overlie each other and a second position in which the first body is rotated from the first position to overlie the second body such that a part of the second body extends beyond the first body and the second short side coincides with or is located apart from the first long or short side.

Portable data device

An imaging device includes a convex mirror for reflecting first incident light representing an object, the convex mirror having a shape of solid of revolution; an imaging mechanism for taking a reflected image represented by light reflected in the convex mirror; and an optical member for guiding the first incident light toward the convex mirror and guiding the reflected light toward the imaging mechanism, the optical member having an attenuation section for attenuating second incident light which is incident on an outer circumferential surface of the optical member in an opposite direction to the first incident light, passes through the optical member, is reflected by an inner circumferential surface of the optical member so as to be directed toward the convex rotational mirror, and is superimposed on the first incident light.

Imaging device with solid optical member

There are provided a first casingA that has a photosensor sectionfor capturing an image, a second casingB that has a lens sectionfor projecting the image of a subject onto the photosensor sectionof the first casingA and a connection sectionC that foldably connects the first casingA with the second casingB. The photosensor sectionand the lens sectionare arranged so that the photosensor sectionand the lens sectionare superposed on each other in a state in which the first casingA and the second casingB are folded together. With this arrangement, the folding type camera device and the folding type portable telephone equipped with this device can be reduced in thickness.

Folding type camera device and folding type portable telephone

When information is received specifying a desired product and a desired light source type, e.g. a type of a light source used in an environment in which the product, if purchased, would actually be used, a server device provides a color reproducing correction process for original image data obtained by shooting the desired product. Specifically, component data corresponding to a color of the light source at shooting and that corresponding to a color of the light source of the desired type are used to correct original image data to attain image data obtained when the product is shot under the desired light source type. The data obtained by the correction is transmitted to a consumer terminal and displayed on a screen. The consumer confirms the displayed image, and if satisfied with e.g. how the product would present color, the process moves on to an on-line transaction process for product purchasing.

IMAGE PROCESSING DEVICE, IMAGE PROCESSING METHOD, RECORDING MEDIUM HAVING IMAGE PROCESSING PROGRAM RECORDED THEREIN AND PROGRAM PRODUCT, FOR PROCESSING IMAGE USING INFORMATION ON LIGHT SOURCE CORRESPONDING TO LIGHTING AT SHOOTING

An object of the present invention is to provide a mass-storage nonvolatile memory device capable of performing high speed operation. The nonvolatile memory device comprises a memory array comprising a plurality of memory cells arranged in a matrix, each of the memory cells comprising a variable resistor element formed of a manganese-containing oxide having a perovskite structure in which an electric resistance is varied by application of a voltage pulse and a variation amount of the electric resistance is variable depending on the magnitude of the voltage amplitude; and a program pulse generation circuit that, in order to program 3-level or larger multi-level data corresponding to one erase state and two or more program states into the variable resistor element, is capable of performing generation of program pulses having two or more different voltage amplitudes corresponding to the program states, the generation being separately performed corresponding to program data.

Nonvolatile memory device

A semiconductor testing apparatus and a semiconductor testing method are provided which permit an apparatus having an inexpensive configuration to perform, with precision, the acceptance-or-rejection determination and measurement test of a semiconductor integrated circuit having a large number of output terminals each for outputting a multi-gradation level output voltage. The semiconductor testing apparatus includes output voltage testing device and comparison voltage generation data inputting device. The output voltage testing device includes test voltage inputting device, comparison voltage generating device, a high level comparator, a low level comparator, and comparison result outputting device. The high level comparator and the low level comparator constitute comparing device for comparing a voltage to be tested, with a comparison voltage.

Semiconductor testing apparatus and semiconductor testing method

To measure the threshold characteristics of an integrated circuit processing a Schmitt circuit at the input side, a clock signal generated from a signal generator is fed to the integrated circuit, and a change of a power source current supplied from a power source circuit to the integrated circuit is detected by a change detector. A control circuit sets the amplitude of a clock signal generated by a driver circuit through digital-to-analog converting circuits. Initially, the voltages of the signal at the high level side and low level side are both set at 0.00 V, and when the voltage of the signal at the high level side, increasing by 0.01 V at a time, reaches the threshold of the Schmitt circuit, a large power source current flows, and a voltage change between the ends of a resistor is detected. As a part of a function test of a test apparatus, the threshold characteristic of the integrated circuit is measured.

Method and apparatus for measuring threshold characteristic of

A current detecting resistance is inserted somewhere in a path for feeding a power source current to a supply voltage terminal VDD of a DUT from a power source of a testing apparatus, and from the potential difference at both ends, a pulse form change due to the state transition of a CMOS circuit in the DUT contained in the power source current is detected. The number of pulse form changes is counted by a counter. In the DUT, a test pattern is applied from a driver, an expected value preset according to the test pattern and the count of the counter are compared, and it is judged whether or not the DUT is in good quality. The current due to a pulse form transition to be detected by the current detecting resistance is larger than the current flowing when the CMOS circuit in the DUT is in a static state, and therefore, the resistance value of the current detecting resistance may be set smaller, so that the time required for testing may be shortened.

Method and apparatus for testing semiconductor integrated circuits

An integrated circuit device is provided with: a substrate; and a plurality of integrated circuit elements formed on the substrate and insulated to each other. Each of the integrated circuit elements includes an internal circuit for performing a predetermined operation when a predetermined electric power is supplied thereto, and an electric source terminal connected to the internal circuit for supplying the predetermined electric power. The integrated circuit device is also provided with a connecting device for electrically connecting one electric source terminal of one integrated circuit element to another electric source terminal of another integrated circuit element, wherein the predetermined electric power is supplied to both of one and another electric source terminals simultaneously through the connecting device so as to simultaneously perform a burn-in process of one and another integrated circuit elements.

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Izumi, Japan

Masayuki Ehiro