Growing community of inventors

Tokyo, Japan

Masayuki Ariyoshi

Average Co-Inventor Count = 3.37

ph-index = 4

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 126

Masayuki AriyoshiKazushi Muraoka (17 patents)Masayuki AriyoshiKazumine Ogura (12 patents)Masayuki AriyoshiKojiro Hamabe (11 patents)Masayuki AriyoshiShingo Yamanouchi (10 patents)Masayuki AriyoshiToshifumi Nakamura (10 patents)Masayuki AriyoshiTatsuya Sumiya (9 patents)Masayuki AriyoshiToshiyuki Nomura (6 patents)Masayuki AriyoshiShinichi Morimoto (6 patents)Masayuki AriyoshiMasanori Sekido (4 patents)Masayuki AriyoshiHiroto Sugahara (3 patents)Masayuki AriyoshiTakeo Fujii (3 patents)Masayuki AriyoshiToshinori Takemura (3 patents)Masayuki AriyoshiDaisuke Matsuo (3 patents)Masayuki AriyoshiNaoya Nakayama (3 patents)Masayuki AriyoshiYasunori Futatsugi (2 patents)Masayuki AriyoshiTaichi Tanaka (2 patents)Masayuki AriyoshiDaisuke Ikefuji (2 patents)Masayuki AriyoshiMasaru Eto (2 patents)Masayuki AriyoshiNagma Samreen Khan (2 patents)Masayuki AriyoshiAkihiko Sugiyama (1 patent)Masayuki AriyoshiEric Cosatto (1 patent)Masayuki AriyoshiYuzo Senda (1 patent)Masayuki AriyoshiMasahiro Kawai (1 patent)Masayuki AriyoshiYasuhiko Matsunaga (1 patent)Masayuki AriyoshiOsamu Hoshuyama (1 patent)Masayuki AriyoshiRiaz Esmailzadeh (1 patent)Masayuki AriyoshiKenichirou Yamazaki (1 patent)Masayuki AriyoshiMai Ohta (1 patent)Masayuki AriyoshiKazurnine Ogura (1 patent)Masayuki AriyoshiMasayuki Ariyoshi (41 patents)Kazushi MuraokaKazushi Muraoka (66 patents)Kazumine OguraKazumine Ogura (16 patents)Kojiro HamabeKojiro Hamabe (167 patents)Shingo YamanouchiShingo Yamanouchi (34 patents)Toshifumi NakamuraToshifumi Nakamura (21 patents)Tatsuya SumiyaTatsuya Sumiya (11 patents)Toshiyuki NomuraToshiyuki Nomura (48 patents)Shinichi MorimotoShinichi Morimoto (16 patents)Masanori SekidoMasanori Sekido (5 patents)Hiroto SugaharaHiroto Sugahara (45 patents)Takeo FujiiTakeo Fujii (27 patents)Toshinori TakemuraToshinori Takemura (13 patents)Daisuke MatsuoDaisuke Matsuo (10 patents)Naoya NakayamaNaoya Nakayama (9 patents)Yasunori FutatsugiYasunori Futatsugi (14 patents)Taichi TanakaTaichi Tanaka (13 patents)Daisuke IkefujiDaisuke Ikefuji (12 patents)Masaru EtoMasaru Eto (3 patents)Nagma Samreen KhanNagma Samreen Khan (2 patents)Akihiko SugiyamaAkihiko Sugiyama (88 patents)Eric CosattoEric Cosatto (82 patents)Yuzo SendaYuzo Senda (76 patents)Masahiro KawaiMasahiro Kawai (58 patents)Yasuhiko MatsunagaYasuhiko Matsunaga (47 patents)Osamu HoshuyamaOsamu Hoshuyama (33 patents)Riaz EsmailzadehRiaz Esmailzadeh (23 patents)Kenichirou YamazakiKenichirou Yamazaki (5 patents)Mai OhtaMai Ohta (1 patent)Kazurnine OguraKazurnine Ogura (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. Nec Corporation (39 from 35,734 patents)

2. The University of Electro-communications (3 from 91 patents)

3. Telefonaktiebolaget Lm Ericsson (publ) (2 from 25,761 patents)


41 patents:

1. 12510653 - Radar apparatus, imaging method, and non-transitory computer-readable medium

2. 12386094 - Processing apparatus, estimation apparatus, and processing method

3. 12339395 - Object detection apparatus, object detection method, and non-transitory computer readable medium

4. 12339359 - Target object detection apparatus, target object detection method, and non-transitory computer readable medium

5. 12299985 - Peak label object detection system and method of using

6. 12259465 - Radar apparatus, imaging method, and non-transitory storage medium

7. 12217508 - Processing apparatus, processing method, and non-transitory storage medium

8. 12085666 - Radar device, imaging method, and imaging program

9. 12055717 - Inspection system and inspection method

10. 11933885 - Radar signal imaging device, radar signal imaging method, and radar signal imaging program

11. 11914035 - Inspection system for inspecting contents of a target person, and inspection method thereof

12. 11860112 - Inspection system and inspection method

13. 11815472 - Inspection system and inspection method

14. 11815597 - Systems and methods for determining contents of a belongings inspection based on a signal

15. 11796676 - Apparatus and method for generating and providing detection model, and non-transitory storage medium

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