Canon Kabushiki Kaisha

Masayoshi Akiyama

Shinichi Takeda

Masato Inoue

Satoru Sawada

Taiki Takei

Toshio Kameshima

Katsuro Takenaka

Tadao Endo

Tomoyuki Yagi

Keigo Yokoyama

Takamasa Ishii

Sho Sato

Toshikazu Tamura

Noriaki Oguri

A radiation image pickup apparatus includes a base, at least one image pickup element, a scintillator, a first heat peelable adhesive layer which is arranged between the base and the image pickup element and which fixes the base and the image pickup element, and a second heat peelable adhesive layer which is arranged between the image pickup element and the scintillator and which fixes the image pickup element and the scintillator, and in the radiation image pickup element described above, the first heat peelable adhesive layer contains first heat-expandable microspheres, the second heat peelable adhesive layer contains second heat-expandable microspheres, and the first heat-expandable microspheres have a different expansion starting temperature from that of the second heat-expandable microspheres.

Radiation image pickup apparatus, radiation image pickup system, and method for manufacturing radiation image pickup apparatus

An imaging operation includes a first imaging operation for outputting image data according to irradiation to the detector with radiation or light in an irradiation field A corresponding to a part of the plurality of pixels, and a second imaging operation for outputting image data according to irradiation to the detectorwith radiation or light in an irradiation field B wider than the irradiation field A, wherein, responsive to a changing from irradiation in the irradiation field A to irradiation in the irradiation field B, an operation of the detector is controlled so that the detector performs an initializing operation for initializing conversion elements during a period between the first and second imaging operations.

Imaging apparatus and imaging system, method thereof and program for the same

A radiation imaging apparatus includes a substrate, at least one imaging element, a scintillator, a first heat peelable adhesive member which fixes the substrate to the imaging element, and a second heat peelable adhesive member which fixes the imaging element to the scintillator. An adhesive strength of the first heat peelable member is decreased by heat. A temperature of the first heat peelable adhesive member at which the adhesive strength is decreased is substantially equal to a temperature at which second heat peelable adhesive member fixes the imaging element to the scintillator. A heat transfer quantity per unit time of the substrate is different from that of the scintillator.

Radiation imaging apparatus, radiation imaging system, and method for manufacturing radiation imaging apparatus

A radiation detection apparatus includes a scintillator panel having a scintillator layer which converts radiation into light and a scintillator protective layer which protects the scintillator layer, and a sensor panel having a sensor array in which a plurality of photoelectric converters which detect light from the scintillator layer are arranged and a sensor protective layer which protects the sensor array. The scintillator panel is bonded to the sensor panel by making the scintillator layer adhere to the sensor protective layer by using the scintillator protective layer as an adhesive material. A principal component of the scintillator protective layer is the same as a principal component of the sensor protective layer.

Radiation detection apparatus, radiation detection system and method of manufacturing radiation detection apparatus

A radiation image pickup apparatus includes a base which transmits ultraviolet rays, a plurality of image pickup elements, a scintillator, at least one ultraviolet peelable adhesive arranged between the base and the image pickup elements so as to fix the base and the image pickup elements in a predetermined position with respect to each other, and a heat peelable adhesive arranged between the image pickup elements and the scintillators so as to fix the image pickup elements to the scintillator.

A radiation detection apparatus comprising semiconductor substrates each having a first surface on which a photoelectric conversion portion is formed and a second surface opposite to the first surface; a scintillator layer, placed over the first surfaces of the semiconductor substrates, for converting radiation into light; and an elastic member, placed between a base and the second surfaces, for supporting the second surfaces of the semiconductor substrates such that the first surfaces of the semiconductor substrates are flush with each other is provided. In measurement of the elastic member as a single body, an amount of stretch of a cubic specimen in a direction parallel to the first surface when being compressed in a direction perpendicular to the first surface is smaller than an amount of stretch of the specimen in the direction perpendicular to the first surface when being compressed in the direction parallel to the first surface.

Radiation detection apparatus and radiation imaging system

An imaging system includes a detector () having a first area where irradiation occurs in a radiation field (A) and a second area other than the first area where irradiation occurs in a radiation field (B) and configured to output image data, and an image processing unit () that performs image processing on the image data. The image processing unit () includes a storage unit () that stores dark output information, a measurement unit () that measures the integral dose of the radiation or light applied to a pixel in the first area and the integral dose of the radiation or light applied to a pixel in the second area, and a correction unit () that corrects the image data, based on the dark output information obtained from the storage unit () and the integral doses measured by the measurement unit (), when changing of the radiation field has occurred.

Imaging system, image processing method therefor, and program therefor

An apparatus includes a detecting unit having pixels that converts radiation or light to electric signals; a drive circuit that drives the detecting unit; a read circuit that outputs the electric signals as image signals; a power supply unit that supplies voltages to the detecting unit, the drive circuit, and the read circuit; and a control unit that controls at least the drive circuit and the power supply unit. The control unit performs a first process of stopping the voltage supply operation to the detecting unit, with the voltage supply operations to the drive circuit and the read circuit maintained; a second process of driving the detecting unit; and a third process of stopping the voltage supply operations to the drive circuit and the read circuit.

Image pickup apparatus and image pickup system

A scintillator includes a scintillator layer which converts radiation into light, the scintillator layer having a first end forming part of a contour of the scintillator layer and a second end forming another part of the contour, wherein the first end and the second end are located on opposite sides of the scintillator layer when viewed from the center of the scintillator layer, wherein an efficiency of conversion from radiation into light decreases from the first end to the second end.

Scintillator, radiation detecting apparatus, and radiation imaging apparatus

An imaging apparatus includes a detector, having a plurality of pixels arranged in a matrix, for performing first and second radiography operations, a bias light source, and a control unit that controls the operation of the detector and the bias light source. In the first radiography operation, image data corresponding to radiation in a first radiation field corresponding to some of the pixels is output. In the second radiography operation, image data corresponding to radiation in a second radiation field larger than the first radiation field is output. In accordance with a change from the first radiation field to the second radiation field, the operation of the bias light source is controlled so that the irradiation with the bias light is performed during a period between the first and second radiography operations at a bias-light integral dose determined based on radiation integral dose information in the first radiography operation.

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Yokohama, Japan

Masayoshi Akiyama