Fuji Electric Co., Ltd.

The University of Tokyo

Masaya Tabaru

Kazuhiro Koizumi

Naoki Takeda

Noritomo Hirayama

Takashi Inui

Kozo Akao

Nobuyuki Takegawa

Michiyasu Okada

Ryoichi Higashi

Takuma Miyakawa

Hideyuki Konishi

It is aimed to analyze a gas component of a to-be-analyzed gas with a reduced influence of a liquid component contained in the to-be-analyzed gas. Provided is an analyzing apparatus for analyzing a gas component of an exhaust gas that has passed through a scrubber apparatus and the like. The analyzing apparatus includes a collecting nozzle configured to collect a to-be-analyzed gas, a liquid collecting unit configured to collect a liquid component contained in the to-be-analyzed gas collected by the collecting nozzle and to allow the to-be-analyzed gas to pass therethrough, a liquid discharging unit configured to discharge the liquid component collected by the liquid collecting unit, and an analyzing unit configured to analyze a gas component of the to-be-analyzed gas that has passed through the liquid collecting unit.

Analyzing apparatus and exhaust gas treating system

A particle detection device includes a scattered light detector detecting an intensity of light scattered by a particle irradiated with a laser, an incandescent light detector detecting an intensity of incandescent light from the particle being irradiated with the laser, and a signal processor including: a first peak hold circuit holding a peak in the intensity of the light scattered by the particle; a second peak hold circuit holding a peak in the intensity of the incandescent light from the particle; and a threshold value comparison circuit comparing the peak in the first peak hold circuit to a threshold and, when the peak in the first peak hold circuit exceeds the threshold, outputs a reset signal to the second peak hold circuit immediately thereafter so the peak previously in the second peak hold circuit is reset immediately after the peak in the first peak hold circuit exceeds the threshold.

Particle detection device

A particle beam forming device for forming either a linear or conical particle beam from a particle source in which particles are dispersed in a gas, includes: a reduced-pressure vessel in which pressure is reduced; a particle beam generating unit, which has one end arranged outside of the reduced-pressure vessel and an other end arranged inside the reduced-pressure vessel, and which captures the particle source from outside the reduced-pressure vessel and introduces the particle beam into the reduced-pressure vessel; and a particle beam evaluating unit for evaluating a spatial distribution of the particle beam inside the reduced-pressure vessel.

Particle beam forming device

Aspects of a laser-type gas analyzer can include a mid-infrared light reception signal processing and computing unit that calculates a gas concentration of the first gas to be measured on the basis of a mid-infrared light reception signal, a near-infrared light reception signal processing and computing unit that detects, at respective times, the gas concentration of the second gas to be measured, water concentration in a space, and alight amount decrement due to dust, on the basis of near-infrared light reception signal. Also included can be a gas concentration correcting unit that corrects the gas concentrations of the first and second gases to be measured using the water concentration and the light amount decrement.

Laser-type gas analyzer

Growing community of inventors

Hino, Japan

Masaya Tabaru