Mitsubishi Heavy Industries Limited

Mitsubishi Aircraft Corporation

Masatsugu Shimizu

Toshikazu Shigetomi

Shuhei Muto

Morimasa Ishida

Kiyotaka Aoki

Hirotoshi Matsumoto

Ryuichi Nagase

Shinichi Tsuji

The present invention provides a method for locating a machining position in a repair material that is arranged on a member including a machined portion formed by predetermined machining, the method including: a step of arranging a marker including a portion having a different propagation characteristic of an ultrasonic wave from that of a peripheral portion in the machined portion existing in the member before the repair material is arranged on the member; and a step of applying the ultrasonic wave to the member covered with the repair material and locating the machining position at a position of the marker captured by the ultrasonic wave after the repair material is arranged on the member.

Method for locating machining position in repair material, and repairing method

Provided are an ultrasonic testing probe and an ultrasonic testing apparatus capable of reducing the time required for flaw detection while maintaining the flaw-detection capability, irrespective of the shape of the inner surface of a tested object. A first probe () and a second probe () are provided, in each of which a plurality of oscillators that transmit ultrasonic waves to a tested object (T) and detect the ultrasonic waves reflected from the tested object (T) are arrayed. The first probe () is disposed closer to a flaw in the tested object (T) than the second probe () is. The first probe () generates longitudinal ultrasonic waves that propagate on an inner surface (T) of the tested object (T) opposite to an outer surface (T) thereof where the first probe () and the second probe () are disposed and transverse ultrasonic waves that propagate from the outer surface (T) toward an inside of the tested object (T). The second probe () generates longitudinal ultrasonic waves that propagate on the outer surface (T) and longitudinal ultrasonic waves that propagate from the outer surface (T) toward the inside of the tested object (T).

Ultrasonic testing probe and ultrasonic testing apparatus

Growing community of inventors

Tokyo, Japan

Masatsugu Shimizu