Sii Nanotechnology Inc.

Seiko Instruments Inc

Other

Aoi Electronics Co., Ltd.

Mitsubishi Denki Kabushiki Kaisha

Mitsubishi Electric Corporation

Hitachi-high-technologies Corporation

National Institute of Advanced Industrial Science and Technology

Hitachi High-tech Corporation

Shizuoka University

Daiken Chemical Co., Ltd.

Masatoshi Yasutake

Shigeru Wakiyama

Osamu Takaoka

Yoshiharu Shirakawabe

Naohiko Fujino

Takeshi Umemoto

Kazutoshi Watanabe

Akio Harada

Yoshikazu Nakayama

Naoya Watanabe

Takashi Okawa

Isamu Karino

Masashi Ohmori

Seiji Akita

Akira Inoue

Masafumi Watanabe

Yuichi Takano

Tomihiro Hashizume

Takashi Kaito

Hiroshi Yokoyama

Tatsuya Miyatani

Hiroyuki Akinaga

Masamichi Fujihira

Takashi Konno

Yukihiro Sato

Itaru Kitajima

Takuya Nakaue

Gerd K Binnig

Nobutaka Nakamura

Atsushi Uemoto

Walter Haeberle

Tsunenori Nomaguchi

Tatsuaki Ataka

Kouji Iwasaki

Toshihiko Sakuhara

Takafumi Miwa

Junichi Tashiro

Hiroyoshi Yamamoto

Takakazu Fukuchi

Tatsuya Adachi

Eisuke Tomita

Yoshiteru Shikakura

Masato Suzuki

Hiroki Hayashi

Sanato Nagata

Hiroshi Ishijima

Ryuichi Matsuzaki

Fumiki Sakai

Shigenobu Yamanaka

Chikara Miyata

Takeo Hattori

Futoshi Iwata

Tatsuya Kobayashi

Yasuyuki Semba

Hiromi Kuramochi

Akihiko Homma

Masahi Ohmori

Syuichi Kikuchi

To enable evaluation of a shape of a fine particle and a fine particle type, a substrate is set as a substrate on which an isolated fine particle to be measured and an isolated standard fine particle in the vicinity of the isolated fine particle to be measured are disposed, and a scanning electron microscope body including a detector configured to detect secondary charged particles obtained by scanning a surface of the substrate with an electron beam probe, and a computer that processes a detection signal and generates an image of the isolated fine particle to be measured and the isolated standard fine particle are provided. The computer corrects a shape of the isolated fine particle to be measured by using a measurement result of the isolated standard fine particle disposed in the vicinity of the isolated fine particle to be measured. Further, by attaching a fine particle spreading tank equipped with a fine particle suspension dropping device inside the microscope body, automatic measurement including dropping of fine particle suspension onto a surface of a surface-modified substrate is possible.

Particle measuring device and particle measuring method

To provide a sample for measuring particles enabling the three-dimensional particulate shape to be measured and the particulate species to be evaluated, the sample for measuring particles includes a substrate; isolated nanoparticles to be measured which are disposed on the substrate; and isolated standard nanoparticles which are disposed on the substrate in the vicinity of the isolated nanoparticles to be measured.

Sample for measuring particles, method for measuring particles and apparatus for measuring particles

Small tweezers having a pair of arms openable and closable is moved closer to a sample and grips a particle attached on a surface of the sample and carries it onto an adhesion member to attach it thereto. The small tweezers are opened to release the particle and brought away from the adhesion member to leave the particle on the adhesion member. A particle removing device includes small tweezers having a pair of arms openable and closable; an opening/closing driving unit that drives the arm or arms to open/close the small tweezers; a stage mounting an adhesion member that attaches thereto a particle to withdraw the particle; and a moving mechanism that moves the small tweezers between the sample and the adhesion member mounted on the stage. Also, an atomic force microscope and a charged ion beam apparatus that include the particle removing device are disclosed.

Particle removing method, particle removing device, atomic force microscope, and charged particle beam apparatus

Provided is a friction force microscope that can measure a friction force by a cantilever in a quantitative manner. The friction force microscope includes a friction force calculating mechanism that calculates an effective probe height and a torsional spring constant of the cantilever from bending sensitivity determined from displacement information in a bending direction of the cantilever and torsional sensitivity determined from displacement information in a torsional direction of the cantilever, respectively, so as to use the calculated values for calculating the friction force.

Friction force microscope

A conductivity measuring apparatus includes a probe base having a pair of electrodes disposed on respective opposite surfaces of a portion of the probe base. Observing and grasping probes are supported by the probe base in a cantilever state and are arranged adjancent to and spaced apart from one another by a predetermined distance. The grasping probe has a pair of electrodes disposed on respective opposite surfaces of a portion of the grasping probe confronting the portion of the probe base. A voltage apparatus applies a voltage between the pairs of electrodes on the probe base and the grasping probe to adjust the predetermined distance between the grasping and observing probes. A movement mechanism moves a sample base and the observing and grasping probes relative to each other to bring conductive tips of the observing and grasping probes into contact with respective contact points on a sample supported on the sample base. A measurement apparatus measures a conductivity between the contact points on the sample on the basis of a current flow generated between the conductive tips of the observing and grasping probes.

Conductivity measuring apparatus and conductivity measuring method

There is a micro-machining apparatus for removing the micro-machining dust generated at the time of machining while a workpiece M is machined within a liquid W using a probe tip. The apparatus includes a stage on which the workpiece is to be placed; a probe having the probe tip, a machining device having a moving means that moves the stage and the probe relative to each other to machine the workpiece by the probe tip, and a micro-machining dust removing device having a first electrode and a second electrode that are arranged in the liquid so as to sandwich the probe tip therebetween, and a voltage application means that applies a voltage to between both the electrodes to move the micro-machining dust in the liquid.

Micro-machining dust removing device, micro-machining apparatus, and micro-machining dust removing method

AFM tweezers that include a first probe, including a triangular prism member having a tip of a ridge which is usable as a probe tip in a scanning probe microscope, and a second probe, including a triangular prism member provided so as to open/close with respect to the first probe, are provided. The first probe and the second probe are juxtaposed such that a predetermined peripheral surface of the triangular prism member of the first probe and a predetermined peripheral surface of the triangular prism member of the second probe face substantially in parallel to each other, and the first probe formed of a notch that prevents interference with a sample when the sample is scanned by the tip of the ridge.

AFM tweezers, method for producing AFM tweezers, and scanning probe microscope

There is provided a scanning probe microscope employing a positioning apparatus Mincluding a unit to be driven in XY direction having a substantially square form in plane geometry at the center of the plane in the XY directions and having a first elastic support that bends in the X-axis direction at least on one side of the square form and a second elastic support that bends in the Y-axis direction at least on one side orthogonal to the side and a support unit that supports a stage unitin the XY directions such that the facing surface can face in parallel against the facing surface of the unit to be driven in the XY directions. The positioning apparatus has a space of a predetermined thickness between the surface corresponding to the unit to be driven in the XY directions at least and the facing surface of the support unit that faces against it, and the space is filled with a viscosity agent.

Positioning apparatus and scanning probe microscope employing the same

A tweezer-equipped scanning probe microscope comprises a first arm with a probing portion, a second arm that moves along an opening direction or a closing direction relative to the first arm, an electrostatic actuator that drives the second arm along the opening direction or the closing direction based upon an opening/closing drive voltage applied thereto, an amplifier that induces self-oscillation in the electrostatic actuator by using an electrically equivalent circuit accompanying the electrostatic actuator as a feedback circuit and causes the second arm to vibrate through the self-oscillation, and a vibration state detection unit that detects a change of vibration state of the second arm as the second arm contacts an object.

Tweezer-equipped scanning probe microscope and transfer method

There is provided a sample manipulating apparatus which is an apparatus for manipulating a sample mounted on a substrate surface, in which at least position data and shape data are acquired by observing the sample. Thereafter, tweezers are positioned by moving means such that the sample is positioned between an observing probe and a grasping probe based on the two set of data. After positioning, a height of the tweezers is set to a position of being remote from the substrate surface by a constant distance by moving means while monitoring a result of measurement by displacement measuring means. Thereafter, the grasping probe is moved to a side of the observing probe while monitoring the result of measurement by the displacement measuring means at the set height and the sample is grasped while detecting a grasping start point.

Sample manipulating apparatus

There is provided a sample operation apparatus in which, by a static electricity force acting between a probe and a sample, an accurate position is gripped without the sample being moved, and the sample can be operated by the probe for an observation, a grip, a release, or the like. In a casing body capable of being sealed, there are installed a sample operation tweezers comprising an observation probe and a grip probe, and a sample base fixing a substrate on which the sample is mounted. By the facts that a surface of the substrate is treated such that its hydrophilic nature is higher than the sample operation tweezers, and that a humidity in the casing body is controlled by a humidity control device, there is made such that an actuation of a grip, a movement, a separation or the like of the sample is performed under a state in which water films are formed on the sample, the substrate and a surface of the sample operation tweezers.

Sample operation apparatus

There is provided a sample operation apparatus in which, by a static electricity force acting between a probe and a sample, an accurate position is gripped without the sample being moved, and the sample can be operated by the probe for an observation, a grip, a release, or the like. There is made such that an AC electric source applying an AC voltage to an observation probe having in its tip and a bias electric source applying a DC voltage are connected, a bias electric source applying the DC voltage a grip probe adjoining the observation probe is possessed, there is relatively moved by a scanner in a plane (XY) direction in regard to a substrate fixed to a sample base, a vibration of the observation probe, which occurs by a static electricity between the tip and the substrate or the sample on the substrate, or the like, is detected by a lock-in amplifier through a displacement detection means, there is applied to the observation probe by the bias electric source such that the vibration becomes small by a feedback circuit, and there is applied also to the grip probe similarly by the bias electric source.

A problem to be resolved by the invention resides in providing a multifunction analyzing apparatus for detecting a shape with high resolution and physical property information capable of not only successively reading a base arrangement from end to end but also specifying a position hybridized by known RNA with regard to a single piece of DNA elongated in one direction on a board. A microscope system of the invention is provided with a fluorescence microscope, a scanning near field microscope and a scanning probe microscope as a detecting system, the microscopes are fixed to a switching mechanism and can be moved to a position at which the various microscopes can observe the same portion of a sample by switching operation of the mechanism. The microscope system of the invention is provided with a function capable of directly detecting a shape and physical property information of one piece of DNA by the scanning probe microscope by multifunction scanning.

Probe microscope system suitable for observing sample of long body

The present invention provides a probe for a scanning magnetic force microscope having a resolution sufficient to allow observation of a magnetic storage medium with 1200 kFCI or higher recording densities, a method for producing the probe, and a method for forming a ferromagnetic alloy film on a carbon nanotube. In the context of the present invention, the probe for a scanning magnetic force microscope comprises a carbon nanotube whose surface is at least in part coated with a ferromagnetic alloy film consisting of any one of a Co&#x2014;Fe alloy and a Co&#x2014;Ni alloy, wherein the arithmetic mean roughness (Ra 10 &#x3bc;m) of the surface of the ferromagnetic alloy film is controlled to 1.15 nm or less. A method for producing such probes for a scanning magnetic force microscope and a method for forming such a ferromagnetic alloy film on a carbon nanotube, so as to achieve such mean surface roughness by controlling the growth rate of the ferromagnetic alloy film within the range of 1.0 to 2.5 nm/min, is also disclosed.

Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubes

In a method for fabricating a nanometer-scale structure by arranging nanotubes in a predetermined direction at a predetermined position, the method for fabricating a nanometer-scale structure comprises a first step of planarizing a substrate by etching a predetermined part by irradiating a focused energy beam to the sample, a second step of decomposing and depositing an organic gas into a columnar structure with an objective of determining the position and direction, and a third step of attaching and fixing the nanotube by using the thus deposited columnar structure as a standard of position and direction.

Method for fabricating nanometer-scale structure

Growing community of inventors

Chiba, Japan

Masatoshi Yasutake