Other

Masatomo Nagashima

Toshio Okuno

Gunji Mizutani

Tadashi Furumi

Atsushi Oguma

An apparatus for inspecting a display board or a circuit board in which an inspection terminal of an inspection probe block B is pressed into contact with an electrode pad of a display board or a circuit portion P for inspection. A probe block supporting frame member has an expandable and contractible structure, and when the probe block supporting frame member is expanded, a board supporting frame member can be relatively advanced. Due to the relative advancement of the board supporting frame member , the display board or the circuit board P protrudes forward of a distal end of the terminal of the probe block B through an enlarged opening area of the probe supporting frame member , so that the display board or the circuit board P supported on the board supporting frame member can be exchanged with another board.

Apparatus for inspecting display board or circuit board

A unit has inspection block blocks mounted thereon in parallel, wherein a plurality of inspection probe blocks are inserted into and removed from a guide rail through a slider so that the probe blocks can be loaded or replaced. Each probe block is slidingly moved along the guide rail so that its positional adjustment can be made in an extension length of the guide rail. Only one kind of support base can commonly be used by inserting and removing different probe blocks with respect to the support base and the positional adjustment can be done. The unit with inspection probe blocks mounted thereon in parallel includes a support base and a plurality of inspection probe blocks each having a plurality of blocks and arranged on the support base in parallel. The probes of each inspection probe block are contacted with electrodes of a display panel or wiring circuit board so that inspection can be carried out, wherein a guide rail is disposed on the support base, the inspection probe blocks are slidably fitted to the guide rail through a slider, and each inspection probe block is fixed to the support base at a predetermined slide position.

Unit with inspection probe blocks mounted thereon in parallel

A supporting framework for a display panel or a probe block is capable of properly coping with display panels of different sizes in a testing apparatus. By moving a framework with a display panel supported thereon or by moving frame members of the framework with a probe block supported thereon, an opening (or space) defined by the respective frame members can be enlarged or reduced.

Growing community of inventors

Kanagawa-ken, Japan

Masatomo Nagashima