Olympus Corporation

Masato Yabe

Daisuke Yokoi

Terumasa Morita

Go Ryu

Norio Maruyama

Yukio Eda

A microscope apparatus including a light source device, a storage table, and a setting controller is provided. The light source device includes a light intensity adjuster which changes light intensity of an illumination light of plural different wavelength regions selectively extracted from light emitted from a light source, and thereby emitting the illumination light including light of the plural different wavelength regions in such a manner that a light intensity ratio of light of one wavelength region to light of another wavelength region is variable. The storage table stores therein set values of the light intensity adjuster for each of combination patterns of the wavelength regions of the illumination light emitted from the light source device. The setting controller makes the light source device change a setting of the light intensity adjuster based on the set value stored in the storage table according to wavelength designation information which designates a combination pattern of the wavelength regions.

Microscope apparatus

A wavelength selection unit includes a light source which emits light of at least a predetermined wavelength region, a collector lens which collects the light emitted from the light source and emits a parallel flux which is inclined relative to a light axis of an optical system of itself, a selective reflection optical system which reflects light of a predetermined wavelength region from the parallel flux selectively, and a returning optical system which returns each reflected flux reflected by the selective reflection optical system symmetrically about a reflected light axis of the selective reflection optical system. The collector lens collects a back flux which is returned by the returning optical system and which is re-reflected by the selective reflection optical system, and forms a light source image of the light source.

Light source apparatus and microscope apparatus

A camera obtains an observation image of a sample by capturing the image of the sample on which an ultraviolet light generated by a light source device is irradiated. An image processing unit of a controlling device generates a synthesis observation image of the sample based on a plurality of observation images of the sample, which are obtained by being captured by the camera in the same field of view with switching of the wavelength band of the ultraviolet light irradiated on the sample. A display unit of the controlling device displays the image generated by the image processing unit.

Ultraviolet microscope apparatus

The present invention provides a focus detection apparatus. In the focus detection apparatus, a luminous flux deformation member is provided to deform a sectional shape of a luminous flux emitted from a light source, and thereby a light quantity difference and a light intensity difference are decreased in light beams which are emitted to a sample surface and received by a photodetector even if objective lenses to be used are differ from each other in a pupil diameter. Consequently, the sample is irradiated with a single spot or multi spots to determine whether or not a focused state is obtained.

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Hachioji, Japan

Masato Yabe