Aisin Seiki Kabushiki Kaisha

Masataka Toda

Munehiro Takayama

Yukio Ichikawa

Toshihiko Yoshikawa

Koji Kuno

Hiroyuki Suganuma

Katsuya Inuzuka

Akira Kozakai

Shiro Yamazaki

Jin Nozawa

Yasuyuki Kuno

Masaru Hisanaga

An inspection device includes: an inspection pattern creating unit that creates an inspection pattern in which first regions each colored with a color different from each other and second regions each colored with a mixed color obtained by mixing at least two of colors with which the first regions are colored are alternately arranged; an irradiation unit that irradiates a surface of an inspection target with the inspection pattern while sliding the inspection pattern by a movement amount; a captured image acquisition unit that acquires a captured image obtained by imaging the surface of the inspection target irradiated with the inspection pattern; and a determination unit that generates color component images obtained by separating the acquired captured image for each of color components of the colors and determines whether or not there is a defect in the surface of the inspection target based on the color component images.

Inspection device

A surface inspection apparatus includes: an inspection pattern forming unit that forms inspection patterns; a projection unit that projects the inspection patterns onto an inspection target object; a captured image acquiring unit that acquires captured images of the inspection target object; an edge extraction image creating unit that extracts edges from captured images, and creates edge extraction images; a correction coefficient setting unit that sets a correction coefficient for correcting intensities of edges in the edge extraction image; an intensity correcting unit that corrects the intensities of the edges; a corrected edge extraction image creating unit that creates corrected edge extraction images; an integrated image creating unit that creates a single integrated image by integrating the brightness values at the same position of the inspection target object; and a determination unit that determines the presence or absence of unevenness on a surface of the inspection target object.

Surface inspection apparatus and surface inspection method

An inspection device includes: an irradiation unit irradiating an inspection target with light by causing a predetermined position within a display screen to emit light; a captured image acquisition unit acquiring a captured image obtained by imaging the inspection target; a calculation unit calculating coordinates in the display screen corresponding to coordinates in the captured image on the basis of light emission position coordinate information and light reception position coordinate information indicating coordinates of a light emission position and a light reception position; and an inspection pattern creation unit creating an inspection pattern which is displayed on the display screen so that first patterns and second patterns are alternately arranged in the captured image and which is used to inspect presence a defect on a surface of the inspection target, on the basis of a calculation result of the calculation unit.

Inspection device, storage medium, and program

A surface profile inspection device producing a sheet of light propagating in a linear region forming a plane from a laser beam emitted from a laser light source and irradiating the sheet of light to an object to be measured, and including an image capturing unit capturing an image of the object to be measured and a configuration data generating unit extracting a light section line defined by an irradiation of the sheet of light from image data of the captured image and generating surface profile data of the object to be measured. The laser light source includes a semiconductor laser emitting a laser beam from a light emitting layer formed in a linear direction along a boarder of a p-n junction. An attitude of the semiconductor laser is set to arrange the linear direction to be unparallel to a spread direction of the sheet of light.

Surface profile inspection device

A concave-convex surface inspection apparatus includes a slit light source unit emitting a slit light to a concave-convex surface of an object to be inspected, an image-taking unit taking an image of the concave-convex surface illuminated by the emitted slit light with an imaging optical axis intersecting with an optical axis of the slit light with a narrow-angle equal to or narrower than 30 degrees, and an evaluation section obtaining a three dimensional shape of the concave-convex surface and evaluating the obtained three dimensional shape, wherein the slit light source unit includes a slit light source and a cylindrical lens, the image-taking unit includes a telecentric lens unit, an image-taking section having an imaging surface tilted relative to the imaging optical axis for increasing a focusing range of the concave-convex surface, and a P polarizer.

Concave-convex surface inspection apparatus

A probe for measuring a depth of a periodontal pocket includes an emitting device for emitting, from a position at a distance from the periodontal pocket, a light beam toward the periodontal pocket, a receiving device for receiving, at a position at another distance from the periodontal pocket, the light beam after being reflected on a bottom of the periodontal pocket, and an analyzing device for displaying the depth of the periodontal pocket after a calculation thereof on the basis of an analysis of the light beam received at the receiving device.

Probe for measuring periodontal pocket depth

A method of processing an image takes a picture of an object by CCD camera, and calculates a center position of an edge of the image of the object formed on an image field to determine the size of the object. A differential between picture elements is formed from image data to detect an edge region. A differential for each picture element located with the edge region is converted into an edge existence width estimate which is centered about the associated picture element and into an edge probability estimate that that picture element is an edge center. These estimates are used to weight the x position of the respective picture element in the edge region. A center x position Ejcp of an assemblage of weighted positions of all the picture elements in the edge region is calculated and is defined to be the center of the edge region.

Growing community of inventors

Toyohashi, Japan

Masataka Toda