Adv Antest Corporation

Masataka Onozawa

Hiromitsu Horino

Yuya Yamada

Aritomo Kikuchi

Mitsunori Aizawa

Tsuyoshi Yamashita

Keisuke Nitta

Yasuyuki Kato

Yuki Koba

An electronic component handling apparatus handles a DUT and includes: an acquiring device that acquires current three-dimensional shape data of a DUT container having a plurality of accommodating portions each capable of accommodating the DUT; and a computer device that: calculates a first correction amount from the current three-dimensional shape data and corrects the current three-dimensional shape data based on the first correction amount; extracts, from the corrected three-dimensional shape data, at least one of a height and a slope of each of predetermined regions of the DUT container; and determines an accommodation state of the DUT based on an extraction result. The first correction amount represents at least one of a movement amount and a rotation amount in a planar direction of the current three-dimensional shape data with respect to an initial state of the DUT container set in advance.

Electronic component handling apparatus and electronic component testing apparatus

An electronic component handling apparatus handles a device under test (DUT). The electronic component handling apparatus includes: a set plate that holds a DUT container including a plurality of pockets each of which accommodates the DUT; a sensor that acquires three-dimensional shape data of the DUT container; and a processor that corrects the shape data based on an inclination of the set plate, extracts a height and an inclination of a predetermined region corresponding to the DUT in a first pocket among the pockets, from the shape data corrected by the processor, and determines an accommodation state of the DUT in the first pocket based on an extraction result obtained by the processor.

An electronic component handling apparatus () is provided which can improve the operation rate. The electronic component handling apparatus () includes: a contact arm () having a holding part () configured to hold a DUT (A), the contact arm () being configured to press the DUT (A) against a socket (); an alignment device () including a camera () and a operation unit (), the camera () being configured to image the DUT (A) to acquire image information, the operation unit () being configured to adjust a position of the holding part () within a range of a maximum alignment amount (AL); and a control device () configured to control the contact arm () and the alignment device (). When a predetermined condition is not satisfied, the control device () controls the contact arm () and the alignment device () so as to perform preliminary alignment work at least once. When the predetermined condition is satisfied, the control device () controls the contact arm () and the alignment device () so as to perform main alignment work.

Electronic component handling apparatus, electronic component testing apparatus, and electronic component testing method

An apparatus for detecting an attitude of electronic components. The electronic components include an electronic component having a plurality of terminals. The apparatus includes a storage and an image processor. The image processor is configured to: extract a binarized image from an image acquired by an imaging device; perform image matching between a terminal in the binarized image and a terminal in a model image to extract attitude candidates of image matching; obtain coordinates of a corner part of the plurality of terminals from the binarized image of the electronic component; select an attitude candidate from among the attitude candidates of image matching; and output the attitude candidate as a detected attitude of the electronic component.

Detector for detecting position of IC device and method for the same

Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket for adjustment which, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder; a socket-for-adjustment position detecting section that detects a relative position of the device under test with respect to the socket for adjustment, in a state in which the device holder fits the socket for adjustment; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the device under test; and a conveyer that conveys the device holder, in which a position of the device under test has been adjusted, to fit the test socket.

Handler apparatus that conveys a device under test to a test socket and test apparatus including the handler apparatus

A handler apparatus adjusts a position of an actuator and enhances positional accuracy of a device under test. Provided is a handler apparatus that conveys a device under test to a test socket, including: an actuator that, prior to fitting of a device holder holding the device under test to the test socket, fits the device holder, and adjusts a position of the device under test on the device holder; and an actuator adjusting section that adjusts an amount of driving of the actuator by causing the actuator to fit an actuator fitting unit.

Handler apparatus, adjustment method of handler apparatus, and test apparatus

Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket fitting unit which the test socket fits, prior to fitting of a device holder holding the device under test to the test socket; a test-socket position detecting section that detects a relative position of the socket fitting unit with respect to the test socket in a state in which the socket fitting unit fits the test socket; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the socket fitting unit; and a conveyer that conveys the device holder in which the position of the device under test has been adjusted, to fit the test socket.

Handler apparatus that conveys a device under test to a test socket and test apparatus that comprises the handler apparatus

Provided is an actuator including: first to third rotation axes provided at a fixed section and having axes in a same direction, first to third rotation sections provided at positions offset from centers of the corresponding rotation axes, and rotating in response to the corresponding rotation axes; a movable section including first and third side walls facing the first and the third rotation sections in a first direction on a movable plane, and a second side wall facing the second rotation section in a second direction, the movable section moving on a predetermined movable plane in response to rotation of the first to third rotation sections; and a biasing section biasing the movable section with respect to the fixed section in at least one of the first direction and the second direction, and making at least one of the first to third rotation sections abut against the corresponding side wall.

Actuator, handler apparatus and test apparatus

A handler for conveying a plurality of devices under test to a socket for a test that can reduce a test time includes: a test section provided with the socket; a heat applying section into which a tray having a plurality of devices under test placed on its surface is conveyed and that controls the temperature of the devices under test to a predetermined test temperature and conveys the tray into the test section; a device image capturing section that in the heat applying section, captures images of the respective devices under test by moving with respect to the surface of the tray in two non-parallel directions of a first direction and a second direction; and a position adjusting section that adjusts the positions of the devices under test with respect to the socket based on the images of the devices under test captured by the device image capturing section.

Handler and test apparatus

A handler for conveying DUTs to a socket for a test that can reduce a test time includes: a test section including the socket; a heat applying section into which a tray having plural DUTs placed on its surface is conveyed and that controls the temperature of the DUTs to a predetermined test temperature and conveys the tray into the test section; and a device image capturing section that includes imaging elements arranged along a first direction the number of which is equal to DUTs arranged along the first direction and that in the heat applying section, captures images of the DUTs by moving the imaging elements relative to the surface of the tray in a second direction non-parallel with the first direction; and a position adjusting section that adjusts the positions of the DUTs relative to the socket based on their images captured by the device image capturing section.

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Saitama, Japan

Masataka Onozawa