Mitsubishi Electric Corporation

Masashi Tatedoko

Takeshi Yoneda

Tsuyoshi Higuchi

Kiyoto Kawauchi

Yuki Fujii

An attack/abnormality detection device includes: a command extraction unit configured to extract elements having the same command destination as a command destination of an additionally received actual manufacturing command from among each of a set of normal manufacturing commands and a set of actual manufacturing commands, which contain information on a command destination and an arrival order, and are stored in a command storage region; and a detection unit configured to detect an attack or an abnormality by comparing details of the commands with each other for each arrival order of both extracted elements.

Attack/abnormality detection device, attack/abnormality detection method, and attack/abnormality detection program

An apparatus for identifying a path pattern of devices that produces a defective product in a production line where a product is produced via a plurality of device is provided. The device is configured to estimate a path pattern quality indicating a quality of a group of products produced through a production path included in a path pattern, based on a production path quality and an association relationship between a path pattern and a production path indicating devices via which the product is produced and an order of passing through the devices; and to identify a path pattern suspected to be defective based on the estimated path pattern quality.

Apparatus, method and computer program for identifying defective devices

A delegation state management unit makes a gateway device perform a verification test to verify whether a correct execution result is obtained in a case wherein a process being a delegation candidate is delegated to the gateway device and the process is executed by the gateway device. Further, the delegation state management unit obtains a result of the verification test from the gateway device, and decides whether to delegate execution of the process to the gateway device, based on the result of the verification test obtained.

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Tokyo, Japan

Masashi Tatedoko