Fujitsu Semiconductor Limited

Fujitsu Corporation

Socionext Inc.

Fujitsu Microelectronics Limited

Masashi Shima

Naoyoshi Tamura

Yosuke Shimamune

Akiyoshi Hatada

Akira Katakami

Toshihide Suzuki

Kazukiyo Joshin

Shunji Nakamura

Hiroyuki Ohta

Kaoru Saigoh

Nobuhiro Misawa

Yoshiki Sakuma

Naoki Hara

Shigeru Kuroda

Takao Sasaki

Tetsuji Ueno

A semiconductor device includes a gate electrode formed on a silicon substrate via a gate insulation film in correspondence to a channel region, source and drain regions of a p-type diffusion region formed in the silicon substrate at respective outer sides of sidewall insulation films of the gate electrode, and a pair of SiGe mixed crystal regions formed in the silicon substrate at respective outer sides of the sidewall insulation films in epitaxial relationship to the silicon substrate, the SiGe mixed crystal regions being defined by respective sidewall surfaces facing with each other, wherein, in each of the SiGe mixed crystal regions, the sidewall surface is defined by a plurality of facets forming respective, mutually different angles with respect to a principal surface of the silicon substrate.

Semiconductor device and fabrication method thereof

A method for manufacturing a semiconductor device includes forming a first gate electrode on a semiconductor substrate in a first transistor region; forming a channel dose region; and forming a first source extension region, wherein the channel dose region is formed by using a first mask as a mask and by ion-implanting a first dopant of the first conductivity type, and the first mask covering a drain side of the first gate electrode and covering a drain region, and the first source extension region is formed by using a second mask and the gate electrode as masks and by ion-implanting a second dopant of a second conductivity type that is a conductivity type opposite to the first conductivity type, the second mask covering the drain side of the first gate electrode and covering the drain region.

Semiconductor device and method for manufacturing semiconductor device

A semiconductor device manufacturing method includes forming a channel dope layer having a first electric conductive-type inside of a semiconductor substrate, the channel dope layer being formed in a region except for a drain impurity region where dopant impurities for forming a low-concentration drain region are introduced, and the channel dope layer being separated from the drain impurity region; forming a gate electrode on the semiconductor substrate via a gate insulating film; and forming a low-concentration source region inside of the semiconductor substrate on a first side of the gate electrode, and forming a low-concentration drain region in the drain impurity region of the semiconductor substrate on a second side of the gate electrode, by introducing second electric conductive dopant impurities inside of the semiconductor substrate with the gate electrode as a mask.

Semiconductor device manufacturing method

A semiconductor device including a low-concentration impurity region formed on the drain side of an n-type MIS transistor, in a non-self-aligned manner with respect to an end portion of the gate electrode. A high-concentration impurity region is placed with a specific offset from the gate electrode and a sidewall insulating film. The semiconductor device enables the drain breakdown voltage to be sufficient and the on-resistance to decrease. A silicide layer is also formed on the surface of the gate electrode, thereby achieving gate resistance reduction and high frequency characteristics improvement.

Manufacturing method of semiconductor device

Semiconductor device having channel dose region and method for manufacturing semiconductor device

A semiconductor device includes first, second and isolation regions; a first insulating film and gate electrode formed over the first region; a second insulating film and gate electrode formed over the second region; a first sidewall formed on a side of the first gate electrode and a second sidewall formed on a side of the second gate electrode; first source and drain regions formed adjacent opposite sides of the first gate electrode; second source region adjacent to the one side of the first gate electrode and overlapping the first source region, an impurity concentration of the second source region being different from an impurity of the first source region; a second drain region overlapping the first drain region and overlapping the first gate electrode; and a metal silicide formed on the first source region and the first drain region.

Method of manufacturing semiconductor device

A semiconductor device has: a low concentration drain region creeping under a gate electrode of a MIS type transistor; a high concentration drain region having an impurity concentration higher than the low concentration drain region and formed in the low concentration drain region spaced apart from the gate electrode; and an opposite conductivity type region of a conductivity type opposite to the drain region formed in the low concentration drain region on a surface area between the high concentration drain region and the gate electrode, the opposite conductivity type region and low concentration drain region forming a pn junction.

Manufacture method of a high voltage MOS semiconductor device

A semiconductor device includes a transistor array including a plurality of transistors each having a gate electrode extended in a first direction, the plurality of transistors being arranged in a second direction intersecting the first direction, and a pad electrode arranged in the first direction of the transistor array and electrically connected to source regions of the plurality of transistors.

Semiconductor device

A semiconductor device includes a silicon substrate having a protrusion, a gate insulating film formed over an upper surface of the protrusion of the silicon substrate, a gate electrode formed over the gate insulating film, a source/drain region formed in the silicon substrate on the side of the gate electrode, a first side wall formed over the side surface of the protrusion of the silicon substrate, the first side wall containing an insulating material, a second side wall formed over the first side wall, the second side wall having a bottom portion formed below the upper surface of the protrusion of the silicon substrate, the second side wall containing a material having a Young's modulus greater than that of the silicon substrate, and a stress film formed over the gate electrode and the second side wall.

Method for fabricating a semiconductor device having stress/strain and protrusion

A semiconductor device includes: a p-type active region; a gate electrode traversing the active region; an n-type LDD region having a first impurity concentration and formed from a drain side region to a region under the gate electrode; a p-type channel region having a second impurity concentration and formed from a source side region to a region under the gate electrode to form an overlap region with the LDD region under the gate electrode, the channel region being shallower than the LDD region; an n-type source region formed outside the gate electrode; and an n-type drain region having a third impurity concentration higher than the first impurity concentration formed outside and spaced from the gate electrode, wherein an n-type effective impurity concentration of an intermediate region between the gate electrode and the n-type drain region is higher than an n-type effective impurity concentration of the overlap region.

Semiconductor device with high voltage transistor

A semiconductor device including a gate electrode formed over a first region of a semiconductor substrate of a first conduction type; a source region and a drain region of the first conduction type formed on both sides of the gate electrode; a channel dope layer of a second conduction type formed in at least a region on a side of the source region of a channel region, the channel dope layer having a concentration gradient of a concentration of a dopant impurity of the second conduction type, which decrease toward the drain region; a first well of the second conduction type having a concentration gradient of a concentration of a dopant impurity of the second conduction type, which decrease toward the drain region; and a second well of the second conduction type formed in the first region, connected to the first well and positioned below the first well.

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Kawasaki, Japan

Masashi Shima