Hitachi-high-technologies Corporation

Nippon Steel Corporation

Nippon Steel Sumitomo Metal Corporation

Sega Corporation

Masashi Sakamoto

Junichi Kodama

Kazuo Aoki

Hiroshi Harada

Kohei Yamaguchi

Takehiro Hirai

Kenji Obara

Kenichi Nakamura

Satoru Yamaguchi

Hideki Nakayama

Masakazu Takahashi

Seiji Isogai

Yoshihiro Daito

Norio Satou

Takuya Takayama

Susumu Koyama

Yui Ito

Toshifumi Honda

Yuji Takagi

Muneyuki Fukuda

Kenji Yamada

Hiroyuki Ito

Naoyuki Sato

Kenji Uchida

Minoru Harada

Yutaka Neishi

Noritsugu Takahashi

Satoshi Takada

Hirohito Okuda

Toshimi Tarui

Atsuko Fukada

Katsuhiro Sasai

Keita Ikeda

Masanori Tsuchimoto

Akira Nishida

Osamu Ooyama

Yuji Tomimasu

This hot-rolled wire rod includes, as a chemical composition, by mass %: C: 0.90% to 1.10%; Si: 0.50% to 0.80%; Mn: 0.10% to 0.70%; Cr: 0.10% to 0.40%; P: 0.020% or less; S: 0.015% or less; N: 0.0060% or less; O: 0.0040% or less; and a remainder consisting of Fe and impurities, in which Formulas (1) and (2) are satisfied by mass %, the structure of the hot-rolled wire rod consists of pearlite in an area ratio of 95.0% or more and a remainder, and TS, which is a tensile strength in unit of MPa, and TS*, which is determined from the C content, the Si content, and the Cr content, satisfy Formula (3),0.50≤[Si]+[Cr]≤0.90  (1)0.40≤[Cr]+[Mn]≤0.80  (2)−50<TS−TS*<50  (3)

Hot-rolled wire rod

Using an apparatus for manufacturing a thin steel sheet including the followings which are arranged in order: a continuous casting machine () for a thin slab having a slab thickness of 70 mm to 120 mm at a lower end of a mold; a holding furnace () that is configured to maintain a temperature of a cast slab () and/or heats the cast slab (); and a rolling stand () by which finish rolling is performed, the casting speed of the thin slab is set to 4 to 7 m/min, the slab () is reduced at a rolling reduction of 30% or more by the reduction roll () after solidification is completed and when a center temperature of the slab is 1300° C. or higher, and the slab () is held at a temperature of 1150° C. or higher and 1300° C. or lower for five minutes or longer in the holding furnace ().

Apparatus for manufacturing thin steel sheet and method for manufacturing thin steel sheet

The device for controlling a flow in a mold in thin-slab casting of steel has a thickness on the short side of the meniscus portion of 150 mm or less and a casting width of 2 m or less and includes a DC magnetic field generation unit and an immersion nozzle having a slit formed at the bottom so that the slit leads to the bottom of the discharge hole and opens outside, the discharge hole and the slit are present in the DC magnetic field zone, and the magnetic flux density B (T) in the DC magnetic field zone and the distance L (m) from the lower end of the immersion nozzle to the lower end of the core satisfy Formulae (1) and (2) described below:0.35&#x2264;1.0&#x2003;&#x2003;Formula (1)&#x2265;0.06 m&#x2003;&#x2003;Formula (2)

Device for controlling flow in mold and method for controlling flow in mold in thin-slab casting

A continuous casting apparatus for a multilayered slab includes a ladle having a molten steel supply nozzle; a tundish having a first retention portion that receives supply of the molten steel from the ladle through the molten steel supply nozzle and has a first immersion nozzle and a second retention portion that is adjacent to the first retention portion with a flow path interposed therebetween and has a second immersion nozzle; an addition mechanism that adds a predetermined element to the molten steel in the second retention portion; and a casting mold that receives supply of the molten steel from the tundish.

Continuous casting apparatus and continuous casting method for multilayered slab

A steel wire for drawing includes, as a chemical composition, by mass %: C: 0.9% to 1.2%, Si: 0.1% to 1.0%, Mn: 0.2% to 1.0%, and Cr: 0.2% to 0.6%, limits Al, N, P, and S to be predetermined ranges, and includes one or more selected from the group consisting of Mo: 0% to 0.20%, and B: 0% to 0.0030%, a remainder of Fe and impurities; in which a metallographic structure includes pearlite, a volume fraction of the pearlite is 95% or higher, an average lamellar spacing of the pearlite is 50 nm to 75 nm, an average length of cementite in the pearlite is 2.0 &#x3bc;m to 5.0 &#x3bc;m, and a ratio of the number of grains of cementite with a length of 0.5 &#x3bc;m or smaller to the cementite in the pearlite is 20% or lower.

Steel wire for drawing

When the degree of matching between patterns decreases due to a pattern fluctuation or an appearance fluctuation that has occurred during manufacturing steps, a heavy work burden would be placed on an operator. A data processing unit of a pattern matching apparatus calculates a threshold for determination of matching between a first template image and a partial region of a search target image obtained by capturing an image of the surface of a sample, on the basis of a result of evaluation of a similarity between the search target image and a second template image, the second template image having been captured in a wider range than the first template image.

Pattern matching method and apparatus

A steel wire rod includes, in terms of mass %, 0.95-1.10% C, 0.10-0.70% Si, 0.20-1.20% Mn, 0.90-1.60% Cr, 0-0.25% Mo, 0-25 ppm B, 0-0.020% P, 0-0.020% S, 0-0.0010% O, 0-0.030% N, and 0.010-0.100% Al. In a surface area of the steel wire rod, the Vickers hardness is HV 300 to HV 420, the area ratio of pearlite is 80% or more, and the area ratio of pro-eutectoid cementite is 2.0% or less. In an inner area of the steel wire rod, the area ratio of pearlite is 90% or more, and the area ratio of pro-eutectoid cementite is 5.0% or less. In the steel wire rod, the area ratio of pearlite blocks having an equivalent circle diameter of more than 40 &#x3bc;m is 0.62% or less, and the difference in Vickers hardness between the surface area and a center portion is HV 20.0 or less.

Steel wire rod for bearings having excellent drawability and coil formability after drawing

A bearing part according the present invention includes, as the chemical composition, by mass %, C: 0.95% to 1.10%, Si: 0.10% to 0.70%, Mn: 0.20% to 1.20%, Cr: 0.90% to 1.60%, Al: 0.010% to 0.100%, N: 0.003% to 0.030%, P: 0.025% or less, S: 0.025% or less, O: 0.0010% or less, and optionally Mo: 0.25% or less, B: 0.0050% or less, Cu: 1.0% or less, Ni: 3.0% or less, and Ca: 0.0015% or less, and a remainder including Fe and impurities; metallographic structure includes a retained austenite, a spherical cementite and a martensite; an amount of the retained austenite is 15% to 25%, by volume %; an average grain size of prior-austenite is 8.0 &#x3bc;m or less; and a number density of a void having a circle equivalent diameter of 0.02 &#x3bc;m to 3.0 &#x3bc;m is 2000 mmor less in the metallographic structure.

Bearing part

In order to reduce the amount of time it takes to collect images of defects, this defect inspection device is provided with the following: a read-out unit that reads out positions of defects in a semiconductor wafer that have already been detected; a first imaging unit that takes, at a first magnification, a reference image of a chip other than the chip where one of the read-out defects is; a second imaging unit that takes, at the first magnification, a first defect image that contains the read-out defect; a defect-position identification unit that identifies the position of the defect in the first defect image taken by the second imaging unit by comparing said first defect image with the reference image taken by the first imaging unit; a third imaging unit that, on the basis of the identified defect position, takes a second defect image at a second magnification that is higher than the first magnification; a rearrangement unit that rearranges the read-out defects in an order corresponding to a path that goes through each of the read-out defects exactly once; and a stage-movement-path generation unit that selects the chip where the reference image corresponding to each defect is to be taken and generates a stage-movement path by determining stage-movement positions for the first and second imaging units.

Defect inspection method and defect inspection device

When contamination or local electrification is generated during acquisition of a low-magnification image, if a high-magnification image contains both a portion in which the contamination or local electrification is generated and a portion in which the contamination or local electrification is not generated, a region whose image quality has changed due to the contamination or local electrification is erroneously recognized as a defect. Thus, defect detection fails or it may be impossible to correctly determine the feature quantity of a defect. The invention provides a defect observation system that acquires sample images at a low magnification and a high magnification, and sets the position or size of the field of view of the high-magnification image or the electron beam irradiation range during acquisition of the low-magnification image no that the image acquired at the high magnification does not contain the outer edge of the image acquired at the low magnification.

Defect observation system and defect observation method

A rolled wire rod includes, as a chemical component, by mass %, C: 0.95% to 1.10%, Si: 0.10% to 0.70%. Mn: 0.20% to 1.20%, and Cr: 0.90% to 1.60%, the balance consisting of Fe and unavoidable impurities, in which a metallographic structure of the rolled wire rod includes, by an area ratio, 90% to 100% of pearlite, 0% to 5% of proeutectoid cementite, and 0% to 10% of degenerate pearlite having granular cementite, an average size of a pearlite block of the pearlite is 1.0 &#x3bc;m to 15 &#x3bc;m, and a maximum size of the pearlite block is 1 to 4 times the average size.

Rolled wire rod and manufacturing method thereof

A data processing unit acquires a review image including a pattern defect on a substrate, compares the review image with a reference image thereby to extract a defect image, the reference image including no pattern defect, and performs an alignment between the review image and a self-layer design pattern image which is generated from design data belonging to the identical layer in a region corresponding to the review image. The data processing unit, then, based on result of the alignment, generates an another-layer design pattern image which is generated from design data belonging to another layer in the region corresponding to the review image, and, based on a synthesized image of the defect image and the another-layer design pattern image, determines the relative position relationship between the pattern defect and a pattern belonging to another layer, and judges the criticality based on the relative position relationship.

Pattern defect analysis equipment, pattern defect analysis method and pattern defect analysis program

A technology whereby removal of magnetic hysteresis is enabled in short time in parallel with a process for stage transfer, and so forth. There is executed a magnetic hysteresis removal sequence whereby current for exciting an electromagnetic coil prior to acquisition of an image is always set to a predetermined variation value against a target value, thereby obtaining information on an image, and so forth, when a diameter of a primary electron beam, converged on the specimen, becomes smaller than dimensions displayed by one pixel of an image to be acquired.

Charged particle beam apparatus

When a racing form speculating a race is selected, a bet is automatically made on a speculated possible finish place. A racing form speculated information indication region Kis provided on the right side of a speculation indication region H. A speculation racing form indication region Kis provided on the right side of the racing form speculated information indication region K. A game player selects a racing form to be used as speculated information. When an all bets button Kbelow a racing form release button K, bets are made maximum 8 sets of horse number combinations speculated by the racing forms. The bet control method can permit game players to easily and quickly bet.

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Hitachinaka, Japan

Masashi Sakamoto