Keyence Corporation

Masashi Nakao

Hajime Matsuda

To make it possible to associate a world coordinate with a coordinate of an imaging device without using a calibration board. A plurality of pattern images are generated by receiving measurement pattern light reflected from a measuring object. X coordinate, Y coordinate, and Z coordinate of a specific point are measured based on a plurality of pattern images, and a calibration target is generated from measurement result of the X coordinate, Y coordinate, and Z coordinate. Calibration is executed using the generated calibration target.

Image processing apparatus

Based on a plurality of first pattern images, a first angle image with each pixel having irradiation angle information of first measuring pattern lights on the measurement object is generated, and based on a plurality of second pattern images, a second angle image with each pixel having irradiation angle information of second measuring pattern lights on the measurement object is generated. In accordance with the irradiation angle information of each pixel in the first angle image, the irradiation angle information of each pixel in the second angle image, and relative position information of a first light projection unit and a second light projection unit, the height of the measurement object in a direction of a central axis of a lighting device is measured.

A feature portion desired by a user out of an inspection target image is accurately positioned. A standard region is set so as to surround a standard pattern in a standard image of a product to be a standard for an inspection target. A sorting region, which is a region for sorting a plurality of candidates similar to the standard pattern, is set in the inspection image. The standard pattern is searched from the inspection image, to extract a plurality of candidates similar to the standard pattern. The sorting region is disposed with respect to each of the plurality of candidates for the standard pattern, extracted in the extraction step, to sort a candidate for the standard pattern based on an evaluation value of the sorting region disposed with respect to each of the plurality of candidates for the standard pattern.

Positioning method for searching a previously registered standard pattern out of an inspection target image

A standard image of a product to be a standard for an inspection target is displayed, to set a first region so as to surround a standard pattern in the standard image. Further, a second region for characterizing a position and a posture of the standard pattern is set in the standard image. In a first search step, a feature extracted from the first region set in the standard image is searched from an inspection target image, to roughly obtain the position and the posture of the standard pattern in the inspection target image. In the second search step, the feature extracted from the second region set in the standard image is searched from the inspection target image, to minutely obtain at least one of the position and the posture of the standard pattern in the inspection target image.

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Osaka, Japan

Masashi Nakao