Olympus Corporation

Olympus Optical Company, Ltd.

Nagoya Institute of Technology

Masashi Kitazawa

Masaki Tanemura

Koichi Shiotani

Akitoshi Toda

Michitsugu Arima

Kazuya Matsumoto

Tatsuhiko Okita

Jun Funazaki

Fumitaka Ozeki

Yukiaki Minamoto

Shigeru Komiyama

Kenji Sato

Mohamad Saufi Bin Rosmi

Ryo Ota

Yazid Bin Yaakob

Junya Tanaka

Riteshkumar Ratneshkumar Vishwakarma

Yuji Wakamatsu

A cantilever used in a scanning probe microscope includes a supporting section, a lever section, and a protrusion section, which is a probe. A crystalline carbon composite layer including a crystalline carbon nanomaterial and a metal material, a melting point of which is 420&#xb0; C. or lower, is deposited on a distal end portion of the protrusion section.

Cantilever and manufacturing method for cantilever

The present invention provides a cantilever for a scanning type probe microscope, the cantilever including a support portion, a lever portion extending from the support portion, a protrusion portion formed on a free end side of the lever portion, an apex angle of the protrusion portion being an acute angle, and a probe in which a fine wire formed at a distal end of the protrusion portion is coated with a functional film, and a major axis/minor axis ratio of a cross-sectional shape of the probe is smaller than a major axis/minor axis ratio of a cross-sectional shape of the fine wire.

Cantilever for a scanning type probe microscope

An SPM cantilever of the present invention including: a support portion () fabricated by processing a single crystal silicon wafer; a lever portion () formed in a manner extended from the support portion; a probe () disposed at a free end side of the lever portion; a coating of graphite film () covering all over the side on which the probe is formed and the entire probe; and a piece of thin line () consisting of a carbon nanofiber (CNF) or carbon nanotube (CNT) or graphite nanofiber (GNF) grown/formed from the graphite film at a probe terminal end portion ().

SPM cantilever and manufacturing method thereof

A carbon thin line probe having a carbon thin line selectively formed at a projection-like terminal end portion thereof by means of an irradiation of high-energy beam, the carbon thin line internally containing a metal. Thereby achieved is a carbon thin line probe suitable for example for the probe of SPM cantilever, which has a high aspect ratio and high durability and reliability, capability of batch processing based on a simple manufacturing method, and to which magnetic characteristic can be imparted.

Carbon thin line probe

Disclosed herein is SPM cantilever having a support portion, a lever portion extended from the support portion and a probe portion formed at a free end of the lever portion, said probe portion having a generally plate-like form and the probe portion having an additionally sharpened terminal end portion. The terminal end portion has its length greater than the plate thickness thereof and is reduced in thickness toward a tip of the terminal end portion, and the tip is located inwardly of the planes extended from the front and back sides of a base portion of the plate-like probe portion.

SPM cantilever and fabricating method thereof

A silicon nitride film is formed all over the surface of a cantilever prepared as including a support portion made by processing single-crystal silicon wafer, a lever portion extended from the support portion, formed with a controlled thickness from single-crystal silicon, and a probe portion made of single-crystal silicon disposed toward the free end of the lever portion with having its probe axis perpendicular to the lever portion, so as to have a greater film thickness on the side face of the probe portion toward the free end of the lever portion, thereby constructing SPM cantilever of configuration where the terminal end portion of the probe portion is tilted toward the free end by a certain angle &#x3b8; with respect to the probe axis. The SPM cantilever thereby can be achieved as capable of measuring surface conditions always at high resolution correspondingly to measuring condition or sample shape.

SPM cantilever

A cantilever for Scanning Probe Microscopy including: a support portion; a lever portion extended from the support portion; and a probe portion provided at an free end of the lever portion, said probe portion being configured by two triangular thin plates each having one side respectively being one of the different two sides of a V-like notch formed on the free end of the lever, where the thin plates are caused to face each other while having the other side in common. The cantilever for Scanning Probe Microscopy is thereby achieved as having a probe portion which is light in weight and high in rigidity and is readily positioned in alignment and by which measurement at high resolution is steadily possible

Cantilever for scanning probe microscopy

An electric charge generator for use in an apparatus for producing an electrostatic latent image includes a plurality of charge generation controlling devices, each charge generation controlling device including: an insulating substrate; a line electrode formed on the insulating substrate; a solid dielectric film formed on the surface of the line electrode; a finger electrode having a hole for generating an electric charge, the hole being formed in the central part of the finger electrode, the finger electrode being formed on the solid dielectric film; a solid insulating film having a hole for passing the electric charge, the hole being formed in the central part of the solid insulating film, the solid insulating film being formed on the finger electrode; and a screen electrode having a hole for ejecting the electric charge, the hole being formed in the central part of the screen electrode, the screen electrode being formed on the surface of the finger electrode via the solid insulating film; wherein the plurality of charge generation controlling devices are arranged on the insulating substrate so as to form the electric charge generator. The solid insulating film is formed of a multilayer solid insulating film including a surface-side layer made of an inorganic insulating film and a substrate-side layer made of an organic insulating film whereby the durability and the reliability are improved.

Growing community of inventors

Ina, Japan

Masashi Kitazawa