Kabushiki Kaisha Toshiba

Toshiba Energy Systems & Solutions Corporation

Fujitsu Corporation

Masaru Otsuka

Hiroyuki Adachi

Satoshi Yamamoto

Jun Semboshi

Setsu Yamamoto

Azusa Sugawara

Takahiro Miura

Makoto Ochiai

Takeshi Hoshi

Satoshi Nagai

Yuji Segawa

Kentaro Tsuchihashi

Kazumi Watanabe

Tadahiro Mitsuhashi

Junichi Takabayashi

Akira Haga

Yoshinori Yoshikawa

Osamu Kikuchi

Kentaro Tsuchuhashi

According to embodiments, an ultrasonic inspection apparatus comprises: an ultrasonic array probe having a plurality of ultrasonic elements; an estimated shape reflected wave arrival time calculator for computing the estimated shape reflected wave arrival time for the estimated shape reflected wave on the basis of the estimated sound velocity in the test object; an actual shape reflected wave arrival time extractor for extracting the actual shape reflected wave arrival time on the basis of the actual shape reflected wave; a shape reflected waves time difference calculator for computing the difference by subtracting the actual shape reflected wave arrival time from the estimated shape reflected wave arrival time as shape reflected waves time difference; and a delay time calculator for computing the delay times for mutually shifting the timings of ultrasonic wave transmission and ultrasonic wave reception by the ultrasonic elements, considering the shape reflected waves time differences.

Ultrasonic inspection apparatus and ultrasonic inspection method

According to an embodiment, a linear-scan ultrasonic inspection apparatus comprises: an ultrasonic array probe having ultrasonic elements aligned in a first direction; a delay-time calculator configured to calculate, referring to the surface shape of the test object, values of delay time of at least one of transmitting and receiving ultrasonic wave; an overlapping-region adjustor configured to set conditions for generating an image of an overlapping region; and an integrated-image generator configured to generate first image data of a region including the overlapping region. The overlapping-region adjustor is configured to set the conditions of the surface shape to be referred to the delay-time calculator in calculating the values of the delay time at either the first-probe setting position or the second-probe setting position as both of a first acquired shape obtained at the first-probe setting position and a second acquired shape obtained at the second-probe setting position.

Linear-scan ultrasonic inspection apparatus and linear-scan ultrasonic inspection method

An ultrasonic flaw detecting apparatus comprises an array prove, an element-group defining circuit, a calculator, a signal receiver and a generator. The array probe comprises a plurality of piezoelectric elements, each of the plurality of piezoelectric elements being configured to transmit and receive an ultrasonic wave to and from an inspection object. The element-group defining circuit is configured to select, as an element group, plural consecutive piezoelectric elements from the plurality of piezoelectric elements, set a reference position of the element group based on array arrangement information of the plurality of piezoelectric elements in the element group and based on a weighting value of each of the plurality of piezoelectric elements in the element group, and calculate a propagation path of an ultrasonic beam from the element group based on the reference position and a predetermined refraction angle. The calculator is configured to calculate a delay time of each of the plurality of piezoelectric elements in the element group in such a manner that the ultrasonic beam is configured to propagate along the propagation path. The signal receiver is configured to receive respective ultrasonic waves received with the plurality of piezoelectric elements as detection signals. The generator is configured to generate at least one composite signal for the ultrasonic beam having the propagation path based on the detection signal and the delay time.

Ultrasonic flaw detecting apparatus, ultrasonic flaw detecting method, and manufacturing method of product

An ultrasonic flaw detector including an ultrasonic probe for emitting an ultrasonic wave on an object to be inspected and receiving a reflected ultrasonic wave from the object, a drive element control unit for controlling a plurality of ultrasonic elements to emit an ultrasonic wave from the ultrasonic probe and to control a reflected ultrasonic wave from the object, and a calculation unit for obtaining, by using a refraction angle of the ultrasonic wave at a time of the ultrasonic wave entering the object, an incident position of the ultrasonic wave on a surface of the object, and a surface shape of a surface of the object at the incident position, the incident angle of the ultrasonic wave entering the incident position, and obtaining a plurality of ultrasonic elements to be driven, based on the incident position and the incident angle.

Ultrasonic flaw detector and ultrasonic flaw detecting method

The inverter functioning as a comparator, dummy inverter having the same electric characteristics as the inverter, and control circuit are provided. Vth detecting input voltage output from the control circuit is input into the dummy inverter, Vth detecting output voltage output from the dummy inverter is input into the control circuit, and the threshold voltage of the dummy inverter is detected. The threshold voltage of the inverter is controlled by controlling the back gate voltages of the MOS transistors of the dummy inverter and the inverter in such a manner that the threshold voltage of the dummy inverter coincide with an external reference voltage.

Comparator and voltage controlled oscillator circuit

Growing community of inventors

Ota, Japan

Masaru Otsuka