Tdk Corporation

Sae Magnetics (h.k.) Limited

Sae Magnectics (h.k.) Ltd.

Masaru Hirose

Mitsuo Otsuki

Yuji Ito

Kei Hirata

Takeo Kagami

Norio Takahashi

Tetsuro Sasaki

Katsuki Kurihara

Shunji Saruki

Yoshihiro Kudo

Takumi Yanagisawa

Takumi Uesugi

Yoshikazu Sawada

Shoji Toyoda

Anthony Wai Yuen Lai

Chi Man Lee

Kwok Piu Tso

The method according to the present invention includes the steps of: sequentially applying a plurality of different voltages to an MR element and sequentially detecting output signals from the MR element; and eliminating the MR element as a defective product when an evaluation value, based on a difference of SN ratios of the output signals from the MR element respectively obtained for each applied voltage, is less than a threshold value, and selecting the MR element as a non-defective product when the evaluation value is greater than or equal to the threshold value.

Method of manufacturing magnetoresistive element

A noise-testing method for a thin-film magnetic head with an MR read head element and a heating unit capable of applying a heat and a stress to the MR read head element, includes a step of applying alternately and discontinuously with each other an electrical power having a first level and an electrical power having a second level higher than the first level to the heating unit, and a step of evaluating the thin-film magnetic head by measuring a noise output or noise outputs obtained from the MR read head element when the electrical power or the electrical powers are applied to the heating unit.

Method for testing noise of thin-film magnetic head, and magnetic disk drive apparatus with noise testing function

Provided is a smear-removing method that can remove smear of a manufactured thin-film magnetic head. The method is performed to a thin-film magnetic head including an MR effect element for reading data having two electrode layers sandwiching an MR effect multilayer as a magneto-sensitive portion therebetween. The method comprises the step of applying a stress voltage less than a breaking voltage of the MR effect element between the two electrode layers to burn off smear. In the method, it is preferable that the stress voltage is applied while an electric resistance or an output voltage of the MR effect element is measured, and the stress voltage is increased until the value of the electric resistance or the output voltage reaches an upper limit specified value specified from a value of an electric resistance or an output voltage in a normal case where smear is not present.

Method for removing smear and magnetic recording/reproducing apparatus with function of removing smear

A head support mechanism includes a suspension for supporting a magnetic head slider with a thin-film magnetic head, having a slider mounting section on which the magnetic head slider is fixed, and a heating unit formed on the slider mounting section of the suspension. The heating unit is capable of producing heat.

Head support mechanism, magnetic head assembly, and magnetic disk drive apparatus

Growing community of inventors

Tokyo, Japan

Masaru Hirose