Hamamatsu-Photonics K.k.

Masaomi Takasaka

Katsumi Shibayama

Hiroshi Okamoto

Yuichi Miyamoto

Koei Yamamoto

Shinya Iwashina

Yuki Okuwa

Takafumi Seko

A radiation image reading device includes: a light scanning unit; a light detection unit. Each of a transmittance when the excitation light reflected from the surface of the recording medium is transmitted through the optical filter and a transmittance when the signal light emitted from the surface of the recording medium at an angle larger than a predetermined angle with respect to a direction perpendicular to the scan line within the detection surface is transmitted through the optical filter is smaller than a transmittance when the signal light emitted from the surface of the recording medium at an angle smaller than the predetermined angle with respect to a direction perpendicular to the scan line within the detection surface is transmitted through the optical filter.

Radiation image reading device

An optical sensor includes: a light emitting element; a lower substrateon which the light emitting elementis provided; an upper substrateprovided so that the light emitting elementis positioned between the upper substrateand the lower substrate; and an optical blockprovided on the upper substrate. The upper substrateincludes a division-type photodiode SD. The optical blockis configured to reflect light emitted from the light emitting elementtoward a measurement target R, and light reflected by the measurement target R is incident onto the division-type photodiode SD.

Optical sensor capable of being applied to a tilt sensor

An optical element includes an optical block through which object light is transmitted along a light transmission axis direction, a first wavelength selection filter provided on a first filter surface set such that a normal line forms an angle &#x3b1; with the light transmission axis, and a second wavelength selection filter located on a rear side with respect to the first wavelength selection filter, and provided on a second filter surface set such that a normal line forms an angle &#x3b1; with the light transmission axis, the second filter surface being in non-parallel, having an opposite inclination direction, and forming an angle 2&#x3b1; with the first filter surface. The optical block is constituted by combining an incidence-side block, a first filter block, a second filter block, and an emission-side block, formed of the same material and in the same shape.

Optical element

A spectroscopic sensorcomprises a plurality of interference filter unitsA,B,C, having a cavity layerand first and second mirror layersopposing each other through the layer, for selectively transmitting therethrough light in a predetermined wavelength range according to an incident position thereof; a light-transmitting substrate, arranged on the first mirror layerside, for transmitting therethrough the light incident on the unitsA,B,C; and a light detection substrate, arranged on the second mirror layerside, for detecting the light transmitted through the unitsA,B,C. The second mirror layersare separated for the respective unitsA,B,C. The cavity layeris formed integrally over the unitsA,B,C, while a part of the layerenters a region between the second mirror layersadjacent to each other.

Spectroscopic sensor

A method of manufacturing a spectroscopic sensorcomprises a first step of forming a cavity layerby nanoimprinting on a handle substrate; a second step of forming a first mirror layeron the cavity layerafter the first step; a third step of joining a light-transmitting substrateonto the first mirror layerafter the second step; a fourth step of removing the handle substrate from the cavity layerafter the third step; a fifth step of forming a second mirror layeron the cavity layerwithout the handle substrate after the fourth step; and a sixth step of joining the light detection substrateonto the second mirror layerafter the fifth step.

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Hamamatsu, Japan

Masaomi Takasaka