Mitutoyo Corporation

Machine Vision Lighting Inc.

Masaoki Yamagata

Kentaro Nemoto

Shiro Igasaki

Tadashi Iwamoto

Yasuhiro Takahama

Eisuke Moriuchi

Yuwu Zhang

Hiraku Ishiyama

Sadayuki Matsumiya

Kentaro Tamura

Jyota Miyakura

Yuki Kurahashi

Ryohei Kanno

Yoichi Toida

Shigeki Masumura

Shohei Udo

Toshihisa Takai

Eiichi Tsunoda

Yoichi Nomura

Nobuyoshi Machida

Bunji Aoyama

Hiroyuki Tokito

Hiroaki Kawata

An illumination device has a light source unit, a lens unit, and a filter unit An imaging device receives object light, generated by the illumination light, from the measurement object at a predetermined observation solid angle, and pixels of the imaging device can each identify the different light wavelength ranges. A processing device includes an arithmetic unit configured to obtain a normal vector at each point of the measurement object corresponding to each pixel from inclusion relation between the plurality of solid angle regions, constituting the object light, and the predetermined observation solid angle, and a shape reconstruction unit configured to reconstruct the shape of the measurement object.

Shape reconstruction method and image measurement device

A shape measuring device includes a holding unit which holds a measuring target of which a shape is to be measured, a first measurement unit which measures relative coordinates of a plurality of measurement points on a first surface of the measurement target with respect to a defined point, a second measurement unit which operates independently from the first measurement unit and measures relative coordinates of a plurality of measurement points on a second surface of the measurement target, which is a reverse surface of the first surface, with respect to the defined point, and a calculation unit which calculates a shape of the measurement target on the basis of results measured by the first measurement unit and the second measurement unit.

Shape measuring device

A shape measuring apparatus includes a first light source, a second light source, an optical system, an image capturer, and a controller. The first light source emits visible light. The second light source emits measurement light used in a measurement. The optical system emits the visible light and the measurement light at the same position on a work piece. The image capturer captures an image of the measurement light reflected by the work piece. The controller is configured to cause the emission of the visible light onto the work piece with the first light source when determining a measurement position, and to control the emission of the measurement light onto the work piece with the second light source when making the measurement.

Shape measuring apparatus

An indicator inspection machine inspects the accuracy of an indicator based on a value displayed by the indicator when a spindle changes position. The indicator inspection machine includes a measurement spindle provided so as to be freely raised and lowered in order to displace the spindle of the indicator; a contact point provided to a distalmost end of the measurement spindle, the contact point making contact with an indicator contact point provided to a distalmost end of the spindle of the indicator; a drive mechanism driving the measurement spindle; and a controller controlling the drive mechanism so as to bring the contact point into contact with the indicator contact point while changing a speed of the measurement spindle at a predetermined periodicity.

Indicator inspection machine, inspection method, and inspection program

Provided is an optical displacement meter capable of enlarging an output signal region with respect to a region in which a light-receiving amount needs to be measured, a method for adjusting an optical displacement meter, and an optical displacement measuring method. The optical displacement meter includes a light-receiving element in which a maximum value of an output signal is set with respect to a boundary value, which is a maximum value of a region in which the light-receiving amount needs to be measured. The entire region of the output signal of the light-receiving element can be assigned to the valid region, in which the light-receiving amount needs to be measured with an optical displacement meter, and the optical displacement meter can have an enlarged output signal region with respect to the region in which the light-receiving amount needs to be measured.

Optical displacement measuring instrument, adjustment method and measuring method of optical displacement measuring instrument

A jig includes three columnar members, a stylus head receiving member, and a jig fixation portion. The second columnar member extends in a Z direction. The first columnar member extends in an X direction and is configured as a cantilever beam protruding in the X direction by having a first end of the first columnar member joined to a first end of the second columnar member. The third columnar member extends in the X direction and is configured as a cantilever beam protruding in the same direction as the first columnar member by having a first end of the third columnar member joined to a second end of the second columnar member. The stylus head receiving member is joined to the third columnar member such that a surface where a stylus head at a forefront end of a spindle of a gauge makes contact faces the first columnar member. The jig fixation portion is provided to the first columnar member so as to be attachable to a measurement spindle of the gauge inspection machine.

Inspection machine and attachment jig therefor

A shape measuring apparatus includes: an irradiating part configured to irradiate work with a linear line laser, the irradiating part including: a light source configured to produce laser light; a first optical member configured to linearly spread the laser light from the light source and generate the line laser; and a second optical member, provided between the light source and the first optical member, configured to adjust an area of irradiation with a line laser on the work; a first sensor configured to receive a line laser reflected by the work and capture an image of the work; a lens configured to form an image of a line laser reflected by the work on an imaging surface of the first sensor; and a control part configured to control adjustment of the area of irradiation with the line laser on the work by the second optical member.

An illumination apparatus according to the present invention includes a light source, a reflecting mirror, an optical system, and a calculator. The reflecting mirror includes a first reflector and a second reflector, and is capable, while changing a reflection angle, of reflecting and directing at an object a first divided light, the first divided light being a portion of light from the light source emitted at the first reflector. The optical system divides the light from the light source into the first divided light and a second divided light, and guides the second divided light to the second reflector. The calculator is capable of calculating the reflection angle of the reflecting mirror by receiving the second divided light reflected by the second reflector.

Illumination apparatus, illumination method, measuring apparatus, and measuring method

Coordinate measuring apparatus includes a probe having an optical system emitting light along a plane at a workpiece, an image capture apparatus having image capture elements arranged on an image capture plane and capturing an image of the workpiece from a position different from that of the predetermined plane, and a controller controlling the emitting optical system. The controller determines whether the image capture elements arranged in an image capture region on the image capture plane detect light incident on the workpiece due to the light from the emitting optical system, turns on the light emitted from the emitting optical system when the image capture elements arranged within the image capture region detect the incident light, and blinks the light emitted from the emitting optical system at a predetermined periodicity when the image capture elements arranged within the image capture region do not detect the incident light.

Coordinate measuring apparatus

An optical probe includes a probe cover, within which is installed an optical system having an illuminating optical system and a receiving optical system. An emitting region and an incidence region through which light passes are provided to a bottom surface of the probe cover, the bottom surface forming an opposing region opposite a work piece. The bottom surface forms a surface where, of the light reflected from the work piece, light following a direct reflection direction is reflected in a direction moving away from the incidence region, from a position where light emitted from the emitting region is emitted at the work piece. Accordingly, an amount of second order reflected light striking the incidence region can be suppressed and, therefore, an occurrence of an erroneous value in received light distribution can be suppressed.

Optical probe, attachable cover, and shape measuring apparatus

An optical probe includes a laser light source that emits laser light, a collimator lens that converts the laser light into parallel light, a light shape changing section that converts the parallel light into linear laser light, an irradiating section to irradiate an object with a selected part of the linear laser light, an image pickup section that picks up an image of the object based on the laser light reflected from the object, and a controller that controls irradiation of the linear laser light. The linear laser light is composed of a plurality of parts including one end part and the other end part; and the irradiating section irradiates the object with the parts of the linear laser light sequentially from the one end part to the other end part.

Optical probe

An image measuring apparatus includes: a light source; an imaging device; and a controller configured to adjust a light emission amount of the light source based on a light reception amount of the imaging device, wherein: when a light reception amount of the light receiving element is more than a maximum value, the controller reduces a light amount of the light source in next light reception; when the light reception amount of the light receiving element is less than the maximum value, the controller increases the light amount of the light source in the next light reception; and when the light amount of the light source reaches the maximum light amount and the light reception amount is smaller than a minimum value, the controller makes the light amount of the light source in the next light reception a minimum light amount.

Image measuring apparatus

A surface texture measuring instrument includes a force sensor (), an actuator () and a detector (). The surface texture measuring instrument further includes: a scanning controller () that collects a detection signal from the force sensor () and drives the actuator such that the detecting signal coincides with a target measurement value; a touch signal generator () that generates a touch signal when the detection signal from the force sensor () coincides with the target measurement value; and a measurement value collecting unit () that collects a measurement value from a counter () at a predetermined time interval in a state where a fluctuation range of the detection signal from the force sensor () is within a preset range when a scanning controller is in operation, the latch counter () collecting a measurement value from a latch counter () each time the touch signal is generated in a state where the detection signal from the force sensor () oscillates and an amplitude exceeds the preset range.

Surface texture measuring instrument

Disclosed is a shape measurement device including: a light irradiation unit which irradiates linear light onto a work; an imaging element which images reflected light reflected by the work; and an image-forming lens which forms an image of the reflected light reflected by the work on an imaging plane of the imaging element, and a light irradiation plane of the light irradiation unit, a principal plane including a principal point of the image-forming lens, and the imaging plane of the imaging element satisfy a Scheimpflug principle. The shape measurement device further includes: an image obtaining region selection unit which divides the imaging plane of the imaging element into a plurality of regions, and selects, as an image obtaining region, a region for use in measurement from the plurality of regions in response to at least one of measurement accuracy and a size of a measurement range.

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Kawasaki, Japan

Masaoki Yamagata