Mitsubishi Denki Kabushiki Kaisha

Seiko Instruments Inc

Sii Nanotechnology Inc.

Mitsubishi Electric Corporation

Nippon Electric Co., Ltd.

Nippon Yakin Kogyo Co., Ltd.

Masao Sato

Tatsunori Fujiwara

Takao Morimoto

Akira Hashimoto

Yasutaka Mizutani

Kazuo Hasegawa

Atsushi Michimori

Junji Kawada

Masaaki Takeshima

Takeshi Inatani

Keiichi Nishikawa

Kenji Shoji

Atsuo Onoda

Yukio Izumi

Takamitsu Sugahara

Hirohiko Sugiura

Masayoshi Kamo

Hidetada Nagaoka

Yoichi Muratomi

Kazunobu Hamatsu

Yuuji Oomura

Kenichi Hashizume

Yuji Ikegami

Hiroyuki Fujii

Shigeo Fushimi

Yoshito Fujiwara

Masaomi Tsuda

Junya Ogura

Yukio Takeuchi

Seiya Shida

An airflow direction plate elongated in a direction perpendicular to a direction of an air flow from an indoor fan is disposed between the indoor fan and an air supply duct opening. The airflow direction plate has air vents arranged in a longitudinal direction, inclined plates each disposed to a corresponding one of the air vents and having different angles of inclination corresponding to positions of the air vents, and an acoustic material disposed on a surface facing the indoor fan. An indoor unit has a first air passageway allowing the air from the indoor fan to flow in the longitudinal direction of the airflow direction plate for a detour to the air supply duct opening and a second air passageway allowing the air from the indoor fan to flow into the air vents along the inclined plates.

Air-conditioning apparatus for vehicle

An X-ray fluorescence film thickness measuring device has an X-ray generating system generating and irradiating primary X-rays. A focusing system focuses primary X-rays irradiated from the X-ray generating system onto microscopic measurement regions in a sample. A sample observation optical system is used to observe the sample during focusing of the primary X-rays for use in positioning of the microscopic measurement regions relative to the primary X-rays. A first sensor with low counting efficiency but high energy resolution detects X-ray fluorescence generated from a sample having the microscopic measurement regions. A second sensor has low energy resolution but high counting efficiency compared to the first sensor. Each of a pair of pre-amplifiers receives a signal from a respective one of the first and second sensors.

X-ray fluorescence thickness measurement device

In order to provide a single, small apparatus capable of elemental and structural analysis of inorganic matter by utilizing X-rays having non-obstructive and non-contact characteristics there is provided a small, energy distribution type X-ray detector for detecting X-ray fluorescence and subjecting the X-ray fluorescence to elemental and quantative analysis, and a CCD line sensor for performing structural analysis. An X-ray tube target structure that is a Cu layer on an Mo layer is adopted. When excitation is performed using a low accelerating voltage, this is made monochromatic by using a Cu filter to filter the Cu&mdash;K lines and the continuous X-rays generated, with the radiation quality (Cu&mdash;K lines) thus generated then being utilized in X-ray diffraction. When excitation is performed using a high accelerating voltage, Cu&mdash;K lines of the Cu&mdash;K lines, Mo&mdash;K lines and continuous X-rays thus generated are blocked by absorption using an Mo or Zr filter, with the Mo&mdash;K lines and continuous X-rays thus obtained being utilized in X-ray fluorescence analysis.

Combined x-ray analysis apparatus

A disk device is provided with an MD carrying mechanism which uptakes an MD , places the MD on a turntable, and performs the ejection of the MD from the turntable by the displacement of the holder drawing lever which forms part of a linking mechanism when the cartridge of the MD is inserted into an MD holder. The disk device also comprises a clamp lever avoidance mechanism which refuges the clamp lever , which is used for clamping the CD , to a position which does not interfere with the uptake and ejection of the MD during uptake and ejection of the MD by the MD carrying mechanism.

Disk device for disks having different sizes

An MD is feed to a fixed position in a device by a case-stored recording medium disk loading mechanism having a slit mechanism , an MD holder feeding arm and the like. The disk is loaded onto a turntable . A drive plate is provided which is driven in a coupled manner and refuges a non case-stored recording medium disk loading mechanism, which has a CD clamp and a CD adapter , to a position which does not interfere with the loading of the MD onto the turntable

Disk device

A disk device is comprised of a CD conveying mechanism which performs the uptake and ejection of CDs by a conveying roller . An MD conveying mechanism drives a clamp lever rotating mechanism which performs the refuge of the clamp lever from an initial position and the return of the clamp lever to an initial position by being driven by a CD loading drive motor. A CD is clamped by a clamp mechanism when the CD is loaded onto a fixed position in the device and directed to a turntable. When an MD is loaded or ejected, the MD conveying mechanism drives the refuge or return of the clamp lever . The placement of an MD on a turntable is performed by an MD placing mechanism which is driven as a result of an MD being taken up to a fixed position in the device.

Disk device for loading and ejecting disks

In order to realize accurate measurement with an X-ray fluorescence thickness tester characterized by being non-destructive and non-contacting, a system comprises an X-ray generating source, a collimator for focusing primary X-rays, and a sample observation optical system for positioning and observation of microscopic sections. As thickness testing means, as detectors for detecting X-ray fluorescence generated from the sample there is one sensor having low counting efficiency but excellent energy resolution used for low energy counting, and another sensor having poor energy resolution but excellent counting efficiency used for counting high energy, these two sensors being arranged next to each other, and in stages subsequent to the detector preamps there are separate linear amps and frequency analyzers with respective signals being subjected to processing as spectrums for qualitative and quantitative analysis in a common control and computing section.

X-ray fluorescence thickness tester

A disk device comprises first and second disk selection projections which regulate an angle of the disk conveyed to a small or large disk positioning recess on the basis of an outer radius of the disk. The first and second disk selection projections have tapered faces provided at fixed intervals on a disk guiding face facing the conveying roller The disk device further comprises steps for positioning the small disk or the large disk having an angle regulated in accordance with the outer radius to the small disk positioning recess or to the large disk positioning recess

Disk device for disks of different sizes

A disk device is includes first support shaft which supports a retaining arm, retaining a second turntable, to reciprocate vertically and a second support arm which supports the retaining arm to rotate and refuge horizontally so that the second turntable which supports a second disk which is not stored in a cartridge and which transmits a rotational force to a second disk can be loaded and separated from a first turntable which supports a first disk and which transmits a rotational force to a first disk.

A disk device is comprised of a feed roller displacement mechanism which displaces a position of a feed roller to a position lower than a position when a CD is inserted. When a CD is ejected from the turntable, the position of the feed roller displaced downwardly is returned to an initial insertion position.

An improved x-ray analyzer may be portable to permit on-site or outdoor analysis without the possibility of emitting harmful x-rays. A housing of the analyzer contains an x-ray generation system for generating x-rays and irradiating the x-rays onto a sample under analysis, an x-ray detection system for detecting x-rays emitted by the sample in response to irradiation of the sample by x-rays by the x-ray generation system, and a safety mechanism for permitting x-rays to be emitted from the housing only when a sample is under analysis. A normally-closed shutter is disposed between the x-ray generation system and a measurement window mounted to the housing through which x-rays are emitted. The safety mechanism includes a first switch which permits the shutter to be opened only when the housing is in contact with a sample under analysis so as to prevent the emission of x-rays from the housing when the housing is not in contact with a sample under analysis. The first switch is a pressure-actuated micro-switch mounted proximate the measurement window so as to become actuated when the measurement window is brought into contact with the sample under analysis to permit opening of the shutter. A hand grip is preferably mounted to the housing and has a second switch mounted thereto and actuatable when the hand grip is engaged by a user's hand to prevent opening of the shutter when the second switch is engaged.

Portable-type fluorescent X-ray analyzer

In order to improve detection efficiency and angular detection characteristics of an in-line X-ray film thickness monitor for monitoring the film thickness of a coated part during production of a product formed using the coated part, the film thickness monitor is provided with an X-ray tube of an end-window type for irradiating an X-ray beam onto the coated part, and an X-ray detector having an annular detecting plane arranged coaxially with the axis of irradiation of the X-ray beam. The X-ray detector detects fluorescent X-rays emitted by the coated part in response to irradiation thereof by the X-ray beam so that the thickness of the coating film can be determined based upon the intensity of the detected fluorescent X-rays.

In-line fluorescent x-ray film thickness monitor

In order to automatically measure the thickness of coatings on a sample, a plurality of calibration curves are stored in a memory circuit beforehand, and X-ray fluorescence generated by irradiation of the sample with primary X-rays is detected by an X-ray fluorescence coating thickness gauge. The X-ray fluorescence is differentiated according to wavelength (energy) by a differentiating circuit. By this differential manipulation, the materials of a sample are identified. Based on the identified constituents of a sample, automatic selection can be made of the most probable and suitable calibration curve out of the plural number of calibration curves stored in a memory and finally coating thickness can be measured on the basis of the selected calibration curve and the intensity of X-ray fluorescence of the sample obtained by the coating thickness gauge.

Coating thickness gauge by X-ray fluorescence

A head assembly moving along a long side of a magnetic card, more than one magnetic head rotating in the head assembly for reading/writing data, a rotary transformer and a carriage with a card holding mechanism for keeping a card at a predefined position are provided in a card reader of the present invention. A rotating part of the rotary transformer in the head assembly receives and sends a signal to the magnetic head and a fixing part of the rotary transformer is connected to a reading/writing circuit. On the card of the present invention, which is usually rectangular, there are tracks defined by plural arcs. The arcs are on plural same-size circles whose centers are aligned on one line along the long side of the card. A magnetic card or an optical card can be used for the present invention.

Card drive apparatus and card

A small and thin storage device that can be substituted for IC memory card is disclosed. When the recording medium cartridge is inserted into the frame of the storage device, a slide member in a hub moves parallel to the frame and retracts a shaft under restriction of a restriction member provided in the recording medium cartridge so that the hub and the shaft engage. When the recording medium cartridge is ejected from the frame, the slide member moves parallel to the frame and the shaft under restriction of the restriction member so as to release the engagement of the shaft and the hub.

Growing community of inventors

Tokyo, Japan

Masao Sato