Kabushiki Kaisha Toshiba

Dainichi Machine and Engineering Co., Ltd.

Masao Kaizuka

Hiroshi Shimizu

Gijun Idei

Kazuma Takakura

A calibration device for a non-destructive inspection/measurement system is provided, including an excitation coil; a detection coil; and a computer that applies a sinusoidal signal or a combined signal including multiple sinusoids having mutually different frequencies to the excitation coil in order to excite a pipe body, and that detects changes in the output voltage of the detection coil. The calibration device calibrates the detection results in the computer by entering, as variables in simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil at multiple calibration points of known thickness on the pipe body. The calibration device performs calibrations by using multiple different calibration conditions at each of the calibration points, and entering, into the simultaneous equations, the amplitudes and phase differences of the output voltage of the detection coil for each of the calibration conditions.

Calibration device for non-destructive inspection/measurement system and non-destructive inspection/measurement method

A circuit has a logic memory, a preceding logic circuit, a succeeding logic circuit, and a function defining circuit. An input signal is taken by the preceding logic circuit, where a new logic state is produced based on the input signal and a present logic state in the logic memory executing a defined calculation. The content of the logic memory is taken over by the new logic state. The succeeding logic circuit produces an output signal based on the logic state of the logic memory executing a defined calculation. The calculation executed in the succeeding or preceding logic circuit is defined by the defining function circuit. Thus, the whole circuit operates with a desired function.

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Yokohama, Japan

Masao Kaizuka