Hitachi Global Storage Technologies Netherlands B.v.

Masanori Aratani

Yasuhiro Iihara

Masahiro Shimizu

Atsushi Tobari

Masaki Kudoh

Junzoh Noda

Kaoru Iseri

Embodiments of the present invention provide an inspection method for detecting a physical defect of a magnetic disk with high sensitivity without increasing the length of inspection time. In a magnetic disk drive according to one embodiment, the assembling of which has been completed, by reading inspection data written to a magnetic disk, a defect of the magnetic disk is detected in a state in which a read error occurs. Redundant bits of an ECC are added to the inspection data. If a head corresponding to a recording surface to be inspected has superior read performance, an ECC 2 is applied. If the head in question has inferior read performance, an ECC 4 is applied. Accordingly, as compared with a case where a single ECC is applied, the defect detectivity is further improved without increasing the length of inspection time.

Surface analysis test with mixed ECC symbol

Embodiments of the invention avoid an off-track write when an impact is applied. A hard disk drive according to one embodiment of the present invention comprises a magnetic disk; an actuator for moving a head element section over the magnetic disk; and an HDC/MPU for prohibiting the head element section from writing onto the magnetic disk for a short period when a detected impact is found to be greater than a low reference level and not greater than a high reference level, and prohibiting the head element section from writing onto the magnetic disk for a period longer than the short period when the detected impact is found to be greater than the high reference level.

Data storage device and data storage device control method

Growing community of inventors

Kanagawa, Japan

Masanori Aratani