Advanced Mobile Telecommunication Technology Inc.

Cryodevice Inc.

Advanced Mobile Telecommunications Technology Inc.

Masanobu Suzuki

Genichi Tsuzuki

A filter has a plurality of resonators formed regularly on a substrate and made of a superconducting material. In measuring resonance frequency of the resonators, the filter and a conductive metal plate having an opening are placed in a vacuum chamber so that all the resonators other than one resonator which faces the opening are covered with the metal plate. The metal plate has an input probe and an output probe at the opening of the metal plate. The resonance frequency of each resonator is measured in sequence while rotating the metal plate. Each resonator is adjusted in shape by a laser trimming or providing a dielectric film in correspondence with the measured resonance frequency so that all the resonators have a fixed resonance frequency.

Method and apparatus for measuring and adjusting resonance frequency of resonators

A filter is composed of plural resonators formed on one surface of a dielectric substrate and a ground plane formed on the other surface. A resonant frequency of each resonator is accurately measured individually and independently from other resonators. Other resonators not selected for measurement are all short-circuited or covered with a conductive member to shift their resonant frequency to a region that does not interfere with the resonant frequency of the resonator under measurement. Also, a coupling coefficient of an arbitrary pair of resonators is accurately measured under no interference from other resonators in the similar manner.

Method of measuring resonant frequency of a resonator and coupling degree of two resonators

Plural resonators formed on a dielectric substrate constitute a filter. The resonant frequency of each resonator is adjusted to a target frequency by accumulating dielectric material on the resonator. The degree of such adjustment is substantially proportional to the amount of the dielectric material. The resonators are originally designed to have a resonant frequency that is a little higher than the target frequency. The resonant frequency of each resonator deviates from the designed target because of various factors in manufacturing processes. Each resonant frequency is measured, its deviation from the target is calculated, and the amount of the dielectric material required to eliminate such deviation is determined before the adjustment process. Accordingly, the adjustment is easily performed without measuring the resonant frequency during the adjustment process.

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Toki, Japan

Masanobu Suzuki