Seiko Instruments Inc

Other

Nissan Motor Company Limited

Dai Nippon Printing Co., Ltd.

Nissan Chemical Industries Limited

Tokyo Institute of Technology

Sii Nanotechnology Inc.

The Head of Agency of Industrial Science and Technology

Masamichi Fujihira

Tatsuaki Ataka

Hiroshi Muramatsu

Uichi Akiba

Norio Chiba

Masatoshi Yasutake

Masaaki Kurihara

Yoshiki Hirata

Shintaro Fujii

Kosaku Suga

Hiroki Okui

Yasuo Nakamura

Kazutoshi Watanabe

Fumie Sato

Takashi Hiraga

Toshihiko Sakuhara

Noritaka Yamamoto

Tatsuya Miyatani

Go Ono

Tetsuo Moriya

Yuuki Takayama

Akihiro Mito

Toshihiro Sakuhara

Enediyne compounds of the formula: (1) characterized in that the structure thereof is very simple and the production process is easy, and that the molecular length thereof is shorter than those of compounds having been proposed. Consequently, electrode assemblies comprising any of these enediyne compounds are highly promising in the application to nanomolecular wiring (nanomolecular wire) whose production has been difficult. 

Monomolecular conductive complex, conductive self-assembled film and assembly of electrode composed of metal and semiconductor making use of the same

A problem to be resolved by the invention resides in providing a multifunction analyzing apparatus for detecting a shape with high resolution and physical property information capable of not only successively reading a base arrangement from end to end but also specifying a position hybridized by known RNA with regard to a single piece of DNA elongated in one direction on a board. A microscope system of the invention is provided with a fluorescence microscope, a scanning near field microscope and a scanning probe microscope as a detecting system, the microscopes are fixed to a switching mechanism and can be moved to a position at which the various microscopes can observe the same portion of a sample by switching operation of the mechanism. The microscope system of the invention is provided with a function capable of directly detecting a shape and physical property information of one piece of DNA by the scanning probe microscope by multifunction scanning.

Probe microscope system suitable for observing sample of long body

A patterning method for micro-contact printing involves the steps of: applying a resin on a master having projected patterns, hardening the resin and thereafter removing the hardened resin from the master to make a stamp of the resin; applying a molecular ink including hydrophobic molecules dispersed in a solvent on the stamp; forming micro-contact printed patterns of the hydrophobic molecular layer on a substrate by means of the stamp on which the molecular ink is applied; dipping the substrate with micro-contact printed patterns in a hydrophilic molecule solution dispersed in a solvent to give chemical modification to the areas of the surface of the substrate around the micro-contact printed patterns, the solution including hydrophilic molecules having a chain length shorter than the chain length of hydrophobic molecules included in the molecular ink is used as the hydrophilic molecule solution. According to the method, printed products having micro-contact printed patterns of a molecular level are obtained with a contrast between the micro-contact printed patterns and the area of the surface of the substrate around the micro-contact printed patterns.

Patterning method with micro-contact printing and its printed product

An apparatus capable of measuring the topography and the optical characteristics of the surface of a sample at high resolution irrespective of the transmittance and the conductivity of the sample is realized. The apparatus comprises a probe, a light source for illuminating a sample with light, a photoelectric converter device and optics for receiving light transmitted through the sample or light reflected by the sample, a laser emitting laser light for detecting deflections of the probe, a condenser lens for directing the laser light to the rear surface of the probe, a detection system for detecting reflected light, a rough-motion mechanism and a fine-motion mechanism for moving the sample and the probe relative to each other, a control means for controlling the distance between the sample and the probe, and a computer for controlling the whole apparatus. The probe has a front end portion and a light-propagating body continuous with the front end portion. The front end portion and the light-propagating body are shaped like a hook. The apparatus observes the topography and the optical characteristics of the surface of the sample.

Scanning near-field optic/atomic force microscope

A signal having a resonant frequency of a cantilever is output by a first oscillator, and supplied to a vibrating element and a control unit to oscillate a probe. A low frequency signal having a large amplitude is output by a second oscillator and supplied to a piezoelectric scanning apparatus. The probe is periodically and relatively moved with respect to the sample between a position where the sample surface is penetrated by the probe and another position where the probe does not penetrate the sample surface and is outside the range of atomic forces caused by the sample. During this movement, the probe movement may be analyzed to obtain a plurality of physical characteristics about the sample, e.g., hardness information of the sample, surface shape information, information related to an adsorption layer of the sample, and information related to physical qualities (for example, electromagnetic field, adsorption force, surface reaction force, electric double layer force in fluid) irradiated from the sample surface along a depth direction.

Three-dimensional scanning probe microscope

An optical probe is used in a near-field effect microscope for performing topographical observation and physical property measurement on a surface of a sample. The optical probe comprises an optical resonator having an optical fiber having at least one microscopic projection composed of a dielectric material disposed at an end portion of the optical fiber for transmitting light.

Optical probe, method of manufacturing an optical probe, and scanning

There is provided an optical memory medium comprising a flat plate modified on the surface thereof by a photolytic residual group, an optical recording apparatus comprising an optical probe having a microscopic aperture on the leading end thereof, a light source, X-Y-Z position control means, and a controller for controlling the apparatus as whole and an apparatus for reading the optical memory medium comprising the optical memory medium, a friction detecting probe, an X-Y-Z position control means and a controller for controlling the apparatus as a whole. Further, information is written and read with high density less than the wavelength of light using an apparatus for writing to and reading from an optical memory piezoelectric medium comprising the optical memory piezoelectric medium constituted by a piezoelectric element modified on the surface thereof by a photolytic residual group, an optical probe having a microscopic aperture on the leading end thereof, a light source, an X-Y-Z position control means, a means for measuring the resonance characteristics of the piezoelectric element and a controller for controlling the apparatus as a whole.

Optical memory medium

Optical information read/write apparatus

An optical scan type tunnel microscope based on a new principle, having higher resolution, is provided. The apparatus of the invention is comprised of at least an optical fiber 3 whose head portion is covered by an energy acceptor 6, a prism on which a sample which contains an energy donator 7 or is covered by the energy donator 7 is placed, a XY-axis transfer mechanism 9, XY-axis control mechanism 10, Z-axis transfer mechanism 11, Z-axis control mechanism 12, light source 13, optical system 14, and an optical detecting system 15.

Fine surface observing apparatus

An electrocatalyst for use in electrolytic reduction of carbon dioxide gas in an aqueous solution. The electrocatalyst is formed of nickel alkyl cyclam which is expressed by the general formula: ##STR1## where each of R.sub.1, R.sub.2, R.sub.3, R.sub.4, R.sub.5 and R.sub.6 is selected from the group consisting of hydrogen atom and aliphatic saturated hydrocarbon group expressed by the formula of C.sub.n H.sub.2n+1 ; wherein at least one of R.sub.1, R.sub.2, R.sub.3, R.sub.4, R.sub.5 and R.sub.6 is the aliphatic saturated hydrocarbon group in which n is a number ranging from 1 to 22. The nickel alkyl cyclam as the electrocatalyst is excellent in stability and energy consumption improving effect while exhibiting a high carbon dioxide gas reduction effect, as compared with conventional nickel cyclam.

Method for electrolytic reduction of carbon dioxide gas using an

A high resolution observation apparatus of material features with a photon scanning microscope. The apparatus detects evanescent light which depends on surface feature of a sample and detects detailed distribution of optical constants of the sample. Namely, the apparatus makes it possible to detect detailed distribution of transparency or refractive index within a sample material in higher resolution than the wavelength of the incident light which is irradiates to the sample material coated on the top surface of the optical prism. The apparatus includes means for maintaining a predetermined distance between the sample and an optical fiber tip or means for detecting a positioning signal. Further, it becomes possible to detect fluorescent condition of the sample.

High resolution observation apparatus with photon scanning microscope

Electrode catalyst for electrolytic reduction of carbon dioxide gas

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Kawasaki, Japan

Masamichi Fujihira