Kabushiki Kaisha Toshiba

Tokyo Shibaura Denki Kabushiki Kaisha

Unisantis Electronics Singapore Pte. Ltd.

Tosbac Computer System Company Limited

Other

Toshiba Microelectronics Corporation

Toshiba Micro-computer Engineering Corp.

Masamichi Asano

Hiroshi Iwahashi

Hideo Kato

Hiroto Nakai

Fujio Masuoka

Kaoru Tokushige

Riichiro Shirota

Masaki Momodomi

Tomoharu Tanaka

Yoshiyuki Tanaka

Yoshihisa Iwata

Seiichi Aritome

Yasuo Itoh

Yutaka Okamoto

Hideko Odaira

Takashi Mori

Hidenobu Minagawa

Tadashi Miyakawa

Yuuichi Tatsumi

Mizuho Imai

Tadayuki Taura

Akira Narita

Nobutake Sugiura

Kiyotaka Uchigane

Shinichi Kikuchi

Tetsuo Endoh

Ryouhei Kirisawa

Taira Iwase

Atsushi Shoji

Satoshi Inoue

Ryozo Nakayama

Shigeru Kumagai

Sadayuki Yokoyama

Michiharu Inami

Kazuto Suzuki

Toshio Yamamura

Isao Sato

Makoto Takizawa

Sachiko Omino

Masazi Mito

Shinji Saito

Kiyoshi Kobayashi

Sumio Tanaka

Koji Saito

Hiroshi Nakamura

Naoki Yamada

Kazunori Kanebako

Kaoru Nakagawa

Hiroaki Kishi

Kazuhisa Kanazawa

Ichiro Kobayashi

Shigefumi Ishiguro

Yasuo Naruke

Hiroshi Harada

Hideki Sumihara

Shigeru Matsuda

Kazuhiko Nobori

Thoru Mochizuki

Yasunori Arime

Satoshi Nikawa

Kazuo Yonehara

Shinichi Maekawa

Yuichi Kawasaki

Kuniyoshi Yoskikawa

Hiroshi Jwahashi

A semiconductor device constituting a decoder circuit for memory selection and having a smaller area is provided by using surrounding gate transistors (SGTs), which are vertical transistors. In a decoder circuit formed by a plurality of MOS transistors arranged in m rows and n columns, the MOS transistors that constitute the decoder circuit are arranged on a planar silicon layer formed on a substrate. Each has a structure including a drain, a gate, and a source arranged in a vertical direction, the gate surrounding a semiconductor pillar. The planar silicon layer is formed by a first active region of a first conductivity type and a second active region of a second conductivity type, and the regions are connected to each other via a conductive region formed on the surface of the planar silicon layer. Consequently, a semiconductor device that constitutes a decoder circuit having a smaller area is provided.

Semiconductor device with a plurality of surrounding gate transistors

A semiconductor device constituting a decoder circuit for memory selection and having a smaller area is provided by using surrounding gate transistors (SGTs), which are vertical transistors. In a decoder circuit formed by a plurality of MOS transistors arranged in m rows and n columns, the MOS transistors that constitute the decoder circuit are arranged on a planar silicon layer formed on a substrate. Each has a structure including a drain, a gate, and a source arranged in a vertical direction, the gate surrounding a silicon pillar. The planar silicon layer is formed by a first active region of a first conductivity type and a second active region of a second conductivity type, and the regions are connected to each other via a silicide layer formed on the surface of the planar silicon layer. Consequently, a semiconductor device that constitutes a decoder circuit having a smaller area is provided.

A semiconductor device includes a 3-input NAND decoder having six MOS transistors arranged in a line. The MOS transistors of the decoder are formed in a planar silicon layer disposed on a substrate and each have a structure in which a drain, a gate, and a source are arranged vertically and the gate surrounds a silicon pillar. The planar silicon layer includes a first active region having a first conductivity type and a second active region having a second conductivity type. The first and second active regions are connected to each other via a silicon layer on a surface of the planar silicon layer.

Semiconductor device

A semiconductor device employs surrounding gate transistors (SGTs) which are vertical transistors to constitute a CMOS NAND circuit. The NAND circuit is formed by using a plurality of MOS transistors arranged in m rows and n columns. The MOS transistors constituting the NAND circuit are formed on a planar silicon layer disposed on a substrate, and each have a structure in which a drain, a gate, and a source are arranged in a vertical direction, the gate surrounding a silicon pillar. The planar silicon layer includes a first active region having a first conductivity type and a second active region having a second conductivity type. The first active region and the second active region are connected to one another via a silicon layer formed on a surface of the planar silicon layer. This provides for a semiconductor device that constitutes a NAND circuit.

Semiconductor device with surrounding gate transistors in a NAND circuit

A semiconductor device employs surrounding gate transistors (SGTs) which are vertical transistors to constitute a CMOS NOR circuit. The NOR circuit is formed by using a plurality of MOS transistors arranged in m rows and n columns. The MOS transistors constituting the NOR circuit are formed on a planar silicon layer disposed on a substrate, and each have a structure in which a drain, a gate, and a source are arranged in a vertical direction, the gate surrounding a silicon pillar. The planar silicon layer includes a first active region having a first conductivity type and a second active region having a second conductivity type. The first active region and the second active region are connected to one another via a silicon layer formed on a surface of the planar silicon layer. This provides for a semiconductor device that constitutes a NOR circuit.

Semiconductor device with surrounding gate transistors in a NOR circuit

A semiconductor device includes a 3-input NOR decoder having six MOS transistors arranged in a line. The MOS transistors of the decoder are formed in a planar silicon layer disposed on a substrate and each have a structure in which a drain, a gate, and a source are arranged vertically and the gate surrounds a silicon pillar. The planar silicon layer includes a first active region having a first conductivity type and a second active region having a second conductivity type. The first and second active regions are connected to each other via a silicon layer on a surface of the planar silicon layer.

A semiconductor device includes a 2-input NOR decoder and an inverter that have six MOS transistors arranged in a line. The MOS transistors of the decoder are formed in a planar silicon layer disposed on a substrate and each have a structure in which a drain, a gate, and a source are arranged vertically and the gate surrounds a silicon pillar. The planar silicon layer includes a first active region having a first conductivity type and a second active region having a second conductivity type. The first and second active regions are connected to each other via a silicon layer on a surface of the planar silicon layer.

Semiconductor device comprising a NOR decoder with an inverter

A semiconductor device includes a two-input NOR circuit including four MOS transistors arranged in a line. Each of the MOS transistors is disposed on a planar silicon layer disposed on a substrate. The drain, gate, and source of the MOS transistor are arranged in the vertical direction. The gate surrounds a silicon pillar. The planar silicon layer is constituted by a first activation region of a first conductivity type and a second activation region of a second conductivity type. The first and second activation regions are connected to each other via a silicon layer disposed on a surface of the planar silicon layer, so as to form a NOR circuit having a small area.

Semiconductor with a two-input NOR circuit

A semiconductor device has a small area and constitutes a CMOS 3-input NAND circuit by using surrounding gate transistors (SGTs) that are vertical transistors. In a 3-input NAND circuit including six MOS transistors arranged in a line, the MOS transistors constituting the NAND circuit have the following configuration. Planar silicon layers are disposed on a substrate. The drain, gate, and source of the MOS transistors are arranged in a vertical direction, and the gate surrounds a silicon pillar. The planer silicon layers include a first active region having a first conductivity type and a second active region having a second conductivity type. The first and second active regions are connected to each other via a silicide layer disposed on surfaces of the planar silicon layers. In this way, a semiconductor device constituting a NAND circuit with a small area is provided.

Semiconductor device with six transistors forming a NAND circuit

A semiconductor device includes a 2-input NAND decoder and an inverter that have six MOS transistors arranged in a line. The MOS transistors of the decoder are formed in a planar silicon layer disposed on a substrate and each have a structure in which a drain, a gate, and a source are arranged vertically and the gate surrounds a silicon pillar. The planar silicon layer includes a first active region having a first conductivity type and a second active region having a second conductivity type. The first and second active regions are connected to each other via a silicon layer on a surface of the planar silicon layer.

A semiconductor device includes a two-input NAND circuit including four MOS transistors arranged in a line. Each of the MOS transistors is disposed on a planar silicon layer disposed on a substrate. The drain, gate, and source of the MOS transistor are arranged in the vertical direction. The gate surrounds a silicon pillar. The planar silicon layer is constituted by a first activation region of a first conductivity type and a second activation region of a second conductivity type. The first and second activation regions are connected to each other via a silicon layer disposed on a surface of the planar silicon layer, so as to form a NAND circuit having a small area.

Semiconductor device with a NAND circuit having four transistors

A semiconductor device has a small area and constitutes a CMOS 3-input NOR circuit by using surrounding gate transistors (SGTs) which are vertical transistors. In the 3-input NOR circuit including six MOS transistors arranged in a line, the MOS transistors constituting the NOR circuit have the following configuration: Planar silicon layers are disposed on a substrate. The drain, the gate, and the source of the MOS transistors are arranged in a vertical direction, and the gate surrounds a silicon pillar. The planar silicon layers include a first active region having a first conductivity type and a second active region having a second conductivity type. The first and second active regions are connected to each other via a silicide layer disposed on surfaces of the planar silicon layers. In this way, a semiconductor device constituting a NOR circuit with a small area is provided.

Semiconductor device with six transistors forming a nor circuit

A semiconductor device has a smaller area. That is, in a row selection decoder including MOS transistors, which selectively connect a plurality of selection signal lines to row selection lines of NAND flash memories having an SGT structure, the MOS transistors are formed on a planar silicon layer that is formed on a substrate, and each have a structure such that a drain, a gate, and a source are disposed in the vertical direction and the gate surrounds a silicon pillar. The planar silicon layer is formed of a first activation region of a first conductivity type and a second activation region of a second conductivity type, and the first and second activation regions are connected with each other via a silicide layer formed on the surface of the planar silicon layer.

The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite operation, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.

Non-volatile semiconductor memory device and memory system using the same

The time required for the program verify and erase verify operations can be shortened. The change of threshold values of memory cells can be suppressed even if the write and erase operations are executed repetitively. After the program and erase operations, whether the operations were properly executed can be judged simultaneously for all bit lines basing upon a change, after the pre-charge, of the potential at each bit line, without changing the column address. In the data rewrite oepration, the rewrite operation is not effected for a memory cell with the data once properly written, by changing the data in the data register.

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Tokyo, Japan

Masamichi Asano