Nidec-read Corporation

Masami Yamamoto

Norihiro Ota

Shigeki Sakai

Yusuke Yokota

Yoshio Tsuji

Norihiro Ohta

Akihiro Yano

Satoshi Furukawa

A contact probe may include a Ni pipe that may include a coiled spring structure, and the Ni pipemay contain 0.5 to 10 wt % of phosphorus (P). The contact probe may have improved durability, by reducing shrinkage, after probing performed in a high temperature environment.

Contact probe and electrical connection jig

A cylindrical body is formed of a conductive member provided with a spiral spring portion. Further, the cylindrical body includes a Ni metal layer and a Ni&#x2014;W alloy layer containing W, and an end portion of the Ni&#x2014;W alloy layer protrudes to an outer side of the Ni metal layer.

Cylindrical body and method for producing same

Provided is a contact probe which may achieve improved heat resistance even when a spring portion thereof is compressed and released in a high temperature environment. The contact probe includes an Ni&#x2014;P layer, and the Ni&#x2014;P layer has different concentrations of P at different positions in a thickness direction of the Ni&#x2014;P layer.

Contact probe

Provided is a connection terminal that maintains an approximately circular shape before or after a cylindrical part is fixed by resistance welding. The connection terminal used for a connection jig interconnecting target points includes a small-diameter conductive part and a large-diameter cylindrical part disposed to surround the small-diameter conductive part. The small-diameter conductive part has a front end protruding from a front end of the large-diameter cylindrical part. A part of the small-diameter conductive part is joined to a part of the large-diameter cylindrical part. A cutout part is formed in a part of a strip portion around an axis of the cylindrical part that at least includes the portion of the large-diameter cylindrical part which is joined to the small-diameter conductive part.

Connection terminal and connection jig

A laser beam irradiation unit irradiates a laser beam on a top surface pattern portion of a wiring to be inspected among plural wirings formed on a substrate, with an intensity high enough to cause laser abrasion or two-photon absorption at the irradiated portion. A D.C. power supply applies, via an ammeter, a predetermined voltage between an electrode portion that traps electrons released from the top surface portion and a contact prove pressed against a bottom surface pattern of the wiring. An open circuit state and a short-circuit state of the wiring are judged using a current value measured in the ammeter. It is thus possible to inspect a wiring for an open circuit and a short-circuit easily without bringing a probe into contact with the lands of wirings on a top surface of the substrate to be inspected.

Growing community of inventors

Kyoto, Japan

Masami Yamamoto